For example: U.S. Patents 4 140 529 and 4 141 729. US. Patents 4 116 862 and 4 145 536. O'Reilly, J. M.; Mosher, R. A.; Goffe, W. L. Photogr. Sci. Eng. Tanda, M., et al. Photogr. Sci. Eng. 1979,23, 290-6. Law, K. Y.; Vincett, P. S.; Loutfy, R. 0.; Alexandru, L.; Hopper, M. A.; Sharp, J. H.; Johnson, G. E.ABSTRACT: For a sensitive measurement of surface molecular orientation by attenuated total reflection (ATR) IR dichroism, a modified sample holder was developed, utilizing a symmetrical, double-edged internal reflection crystal. This modified sample holder allows the sample to be rotated without the disassembling and reasembling operations which change the contact area between the polymer and the ATR crystal. Therefore correction of the reflectivities to an internal standard absorption band which is insensitive to orientation is not necessary with this modified apparatus. This was tested on two types of polypropylene. Results with uniaxially drawn polypropylene show that the surface orientation is similar to the bulk, as expected. On the other hand, the orientation as measured by this technique was greater on the surface than in the core of an injection-molded polypropylene plate, a tendency confirmed by birefringence. This technique can be used for estimating bulk orientation of a thick sample without sectioning when the surface has similar orientation to the bulk. In cases where the surface differs significantly in orientation from the bulk, our technique should provide a surface-sensitive estimation of orientation, since the surface probed is only about 1 pm in this technique.