Anodic oxides on InAlP formed in sodium tungstate electrolyte

Suleiman, Amal; Skeldon, P.; Thompson, G.E.; Echeverría, Félix; Graham, M. J.; Sproule, G. I.; Moisa, S.; Quance, T.; Habazaki, H.

doi:10.1016/j.corsci.2009.10.019

Cited by 3 publications

(2 citation statements)

References 24 publications

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“…With the growing of oxygen bubbles, the oxygen bubble is eventually released (shown in the right of Fig. 3c) due to the rupture of ACA layer at the point R. The electrolyte must fill the regular pore [21]. The voltage begins to decline from point R to point S in Fig.…”

Section: Resultsmentioning

confidence: 97%

Self-Ordering of Cell Arrangement in Porous Anodic Alumina

Zhu

Han

Song

et al. 2011

AMR

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A convincing interpretation to hexagonal prism ordered-arrangement and self-ordering cell in porous anodic alumina (PAA) is absent up to now. Based on the growth model of oxygen bubble mould effect (OBME) for PAA, a satisfactory explanation for the growth process of hexagonal cells is proposed. The columnar pores and hexagonal cells result from the oxide growth embracing oxygen bubbles. The avalanche electron multiplication at critical thickness dc leads to electronic current which gives rise to the evolution of oxygen gas under anion-contaminated alumina (ACA) layer. The holes on the surface are usually irregular whereas the pores under the surface layer (ACA layer) are big and regular. The thickness of the barrier oxide layer remains constant due to continuous releasing of the oxygen bubbles at the critical thickness. The self-ordering of cell arrangement and the ordered morphology are related to the dissolving process of the ACA layer on PAA surface.

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Section: Resultsmentioning

confidence: 97%

Self-Ordering of Cell Arrangement in Porous Anodic Alumina

Zhu

Han

Song

et al. 2011

AMR

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“…The presence of an interfacial oxide layer was assessed and its features were examined using two techniques. Electronic microscopy having been used for a long time to observe the structure and the thickness of anodic films on aluminum alloys [10,[12][13][14][15], we selected Transmission electron microscopy (TEM) as the reference technique for direct observation of the oxide layer. On the other hand, depth profiles obtained from ToF-SIMS analyses are known to provide accurate chemical information about thin layers and coatings [16][17][18].…”

Section: Introductionmentioning

confidence: 99%