Anomalous piezoelectric and elastic properties of a tetragonal PZT ceramic near morphotropic phase boundary

Abstract

A ceramic of nominal formula Pb0.95Sr0.05(Zr0.53Ti0.47)0.98Nb0.02O3 has been investigated. Dielectric properties and differential scanning calorimetry tests pointed to a transformation temperature of 306 °C. By means of a dynamic method the piezoelectric and complex elastic compliances for polarized ceramics have been measured as a function of temperature. The temperature dependence of the elastic properties has indicated bilinear coupling between the order parameter and strain. The unexpected existence of a pertinent piezoelectric response far above accompanied by strong changes in the elastic properties was observed. On the basis of the dielectric response and x-ray diffraction studies carried out on poled and unpoled ceramics, the influence of the compositional fluctuations and the existence of polar regions on the anomalous piezoelectric activity above were considered rather than a change of symmetry after the action of an external electric field.

High-temperature macroscopic piezoelectricity in Nb-dopedPbZr1−xTixO3ceramics driven

“…1͒ and strontium-doped PZT ceramics with very similar compositions. 11 This probably means that poling only causes 180°domain walls to move, which does not influence the second-rank dielectric permittivity tensor.…”

Elastic Properties and Enhanced Piezoelectric Response at Morphotropic Phase Boundaries

“…Other reports have appeared of the elastic properties at frequencies of Hz and kHz of PZT at compositions near the MPB [137,138,139,140], but a systematic anelastic and dielectric study of the whole phase diagram of PZT, with particular care to the MPB region, has been conducted by Cordero and coworkers [76,77,78,80] with the method of the free flexural resonance.…”

Quantitative chemical analysis of fluorite-to-perovskite transformations in (Pb,La)(Zr,Ti)O3 PLZT thin films

“…4,6 In magnetron RFsputtering of PZT, excess Pb has been deposited by cosputtering a PZT and PbO target, and varying the power to the PbO target to control PbO excess in the film. [24][25][26][27] The present work is meant to quantitatively study the effects of this new two-crystallization processing approach on the cation distribution in P(L)ZT thin films. 8,16,17 However, the problems of Pb loss are compounded when thin films are grown.…”