Anomalous Transmission of X Rays Scattered by Phonons in a Germanium Crystal

Kashiwase, Yasuji; Mori, Masahiro; Kogiso, Motokazu; Ushida, Katsutoshi; Minoura, Mao; Ishikawa, Tetsuya; Sasaki, Satoshi

doi:10.1103/physrevlett.62.925

Cited by 5 publications

(2 citation statements)

References 7 publications

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“…Quantitative measurement was further carried out in some detail using monochromatized synchrotron radiation and a triple-crystal diffractometer. The excess line was thereby reasonably explained by the anomalous transmission of TDS X-rays caused by dynamical diffraction and absorption in perfect crystals (Kashiwase, Mori, Kogiso, Ushida, Minoura, Ishikawa & Sasaki, 1989).…”

Section: Introductionmentioning

confidence: 75%

Diffraction effect of X-ray diffuse scattering in a disordered Cu–Al alloy

Mori¹,

Kashiwase²,

Kogiso³

et al. 1990

Acta Cryst Sect A

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A white (defect) line which appears as a dip in intensity distribution was clearly observed in the 200 diffuse scattering from a Cu-A1 disordered crystal at room temperature in the Bragg geometry by using both photographic and counter methods. The line is caused by the extinction effect on the 200 Bragg reflection, subsequent to the diffuse scattering, in a process similar to the case of mosaic crystals. The diffuse scattering is caused by the static displacement as well as the thermal motion of atoms. The observed contrast of the line is quantitatively in fair agreement with that calculated.

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Section: Introductionmentioning

confidence: 75%

Diffraction effect of X-ray diffuse scattering in a disordered Cu–Al alloy

Mori¹,

Kashiwase²,

Kogiso³

et al. 1990

Acta Cryst Sect A

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“…In the range of hard x-rays (tens of keV to MeV photon energy) where a matching natural periodicity of crystalline materials is available, the effect has been exploited for realizing x-ray polarizers [18][19][20], for x-ray monochromatization and signal enhancement [21], for detection of micro-defects [22], for spectroscopy of quadrupole transitions [23], or for the measurement of thermal diffuse scattering [24,25]. Anomalous transmission was predicted by one of us to occur also in amorphous multilayer structures [14], but there is no experimental observation so far.…”

Section: Anomalous Transmissionmentioning

confidence: 99%

Narrowband and tunable anomalous transmission filters for spectral monitoring in the extreme ultraviolet wavelength region

et al. 2017

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We present the first experimental demonstration of a novel type of narrowband and wavelength-tunable multilayer transmission filter for the extreme ultraviolet (EUV) region. The operating principle of the filter is based on spatially overlapping the nodes of a standing wave field with the absorbing layers within the multilayer structure. For a wavelength with a matching node pattern, this increases the transmission as compared to neighboring wavelengths where anti-nodes overlap with the absorbing layers. Using Ni/Si multilayers where Ni provides strong absorption, we demonstrate the proper working of such anomalous transmission filter. The demonstration is carried out at the example of 13.5 nm wavelength and at normal incidence, providing a 0.27 nm-wide transmission peak. We also demonstrate wavelength tunability by operating the same Ni/Si filter at different wavelengths by varying the angle of incidence. As the multilayer filter is directly deposited on the active area of an EUV-sensitive photodiode, this provides an extremely compact device for easy spectral monitoring in the EUV. The transmission spectrum of the filter is modeled and found to be in good agreement with the experimental data. The agreement proves that such filters and compact monitoring devices can be straightforwardly designed and fabricated, as desired, also for other EUV wavelengths, bandwidths and angles of incidence, thereby showing a high potential for applications. (23), 3207-3212 (2004). 10. W. Schwanda, K. Eidmann, and M. C. Richardson, "Characterization of a flat-field grazing-incidence XUV spectrometer," J. X-Ray Sci. Technol. 4(1), 8-17 (1993). 11. N. Nakano, H. Kuroda, T. Kita, and T. Harada, "Development of a flat-field grazing-incidence XUV spectrometer and its application in picosecond XUV spectroscopy," Appl. Opt. 23 (14), 2386-2392 (1984 of free-standing, high-line-density transmission gratings for the vacuum UV to soft X-ray range," Opt. Express 23(4), 4421-4434 (2015).

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