2020 International Wireless Communications and Mobile Computing (IWCMC) 2020
DOI: 10.1109/iwcmc48107.2020.9148056
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Anti-SEU design of SRAM based on FinFET process

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“…The following year, they achieved the manufacture of the first p-type FinFET with a gate length of 18 nm, a channel width of 15 nm, and a fin height of 50 nm. This marked the advent of the FinFET era [8].…”
Section: Development Historymentioning
confidence: 99%
“…The following year, they achieved the manufacture of the first p-type FinFET with a gate length of 18 nm, a channel width of 15 nm, and a fin height of 50 nm. This marked the advent of the FinFET era [8].…”
Section: Development Historymentioning
confidence: 99%