Application of an image processing software tool to crack inspection of crystalline silicon solar cells

Jean, Jong-Hann; Chen, Chia-Hong; Lin, Hsiu-Li

doi:10.1109/icmlc.2011.6017015

Cited by 12 publications

(5 citation statements)

References 6 publications

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“…Jong-Hann et al [81] developed software and hardware for an automatic optical inspection system to inspect the facial cracks of polycrystalline silicon solar cells or modules. They used the EL imaging technique with a CCD interlaced camera with 768 × 494 pixels resolution with optical lens mounted and illumination unit [81].…”

Section: Electroluminescence Imaging and Photoluminescence Imagingmentioning

confidence: 99%

“…They used the EL imaging technique with a CCD interlaced camera with 768 × 494 pixels resolution with optical lens mounted and illumination unit [81]. The software [81] is based on the use of a Windowsbased user interface to implement the average gray level tool and the binary large object (BLOB) tool. However, it is difficult to distinguish between microcracks and other type of defects like scratches using this approach.…”

Section: Electroluminescence Imaging and Photoluminescence Imagingmentioning

confidence: 99%

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Review of Microcrack Detection Techniques for Silicon Solar Cells

Abdelhamid

Singh

Omar

2014

IEEE J. Photovoltaics

118

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Microcracks at the device level in bulk solar cells are the current subject of substantial research by the photovoltaic (PV) industry. This review paper addresses nondestructive testing techniques that are used to detect microfacial and subfacial cracks. In this paper, we mainly focused on mono-and polycrystalline silicon PV devices and the root causes of the cracks in solar cells are described. We have categorized these cracks based on size and location in the wafer. The impact of the microcracks on electrical and mechanical performance of silicon solar cells is reviewed. For the first time, we have used the multi-attribute decision-making method to evaluate the different inspection tools that are available on the market. The decision-making tool is based on the analytical hierarchy process and our approach enables the ranking of the inspection tools for PV production stages, which have conflicting objectives and multi-attribute constraints.

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Section: Electroluminescence Imaging and Photoluminescence Imagingmentioning

confidence: 99%

Section: Electroluminescence Imaging and Photoluminescence Imagingmentioning

confidence: 99%

Review of Microcrack Detection Techniques for Silicon Solar Cells

Abdelhamid

Singh

Omar

2014

IEEE J. Photovoltaics

118

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“…Breitenstein et al [125] reported that the EL method is superior to the LIT method in terms of cost and quality of the image. The authors of [126,127] have developed software and integrated it with the hardware to develop an automated inspection process for inspecting facial cracks in silicon cells. However, it is difficult to identify between surface cracks and micro-defects using this approach.…”

Section: El Imagingmentioning

confidence: 99%

Multi‐attribute analysis of micro‐defect detection techniques suitable for automated production line of solar wafers and cells

Saleem

Al-Amri

2020

IET Renewable Power Generation

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Renewable energy is going to play an immensely important role in the coming decades. Hence, the bulk manufacturing of solar panels has seen a renewed interest. For this purpose, it is imperatively important to assess the techniques that can be employed on automated production lines for evaluating the quality of solar wafers and cells. To-date many non-destructive testing methods to access the micro-defects in solar wafers and cells have been developed around the globe; however, not all of them can be applied on a fast-paced production line. In this regard, this study details all the nondestructive evaluating techniques that can be employed on an automated production line. Using a multi-attribute decisionmaking method, a strategic evaluation procedure is developed that can be adopted for the optimum selection of evaluation tools currently available in the market. This study is aimed at young researchers, graduate students and practitioners who want to come up-to-speed regarding the various defects that occur in solar wafers and cells along with the techniques that are currently being adopted to evaluate those defects. Also, future trends in research are highlighted regarding the development of assessment techniques.

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“…The problem of resolving micro-cracks from these complex luminescence images has been the subject of numerous image processing studies in recent years [4,43,[53][54][55][56][57][58][59][60][61][62][63]. However, in practice, there is very little distinction between micro-cracks and unwanted noise such as cosmetic scratches, dislocation clusters and grain boundaries.…”

Section: Solar Cellmentioning

confidence: 99%