Application of Digital SIMS Imaging to Light Element and Trace Element Mapping

Newbury, D. E.; Bright, David S.; Williams, David B.; Sung, Changmo; Page, T. F.; Ness, J. N.

doi:10.1007/978-3-642-82724-2_69

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Sims a R T E F A C T S I N B U L K Electropolished Specimens1

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1987

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“…Alloy bulk specimens containing 12.7 at.% Li, aged for 100 h at 250°C and prepared as described above, were first observed in a Cameca IMS 3F ion microscope at the National interpretable as Li-rich 6 precipitates on grain boundaries surrounded by a Li-depleted region (Newbury et al, 1986). This ion image corresponds to many TEM images in the literature in which 6 in grain boundaries is observed along with a Li-depleted precipitatefree zone (PFZ), e.g.…”

Section: Sims a R T E F A C T S I N B U L K Electropolished Specimensmentioning

confidence: 99%

High spatial resolution secondary ion imaging and secondary ion mass spectrometry of aluminium‐lithium alloys

Williams¹,

Levi‐Setti²,

Chabala³

et al. 1987

Journal of Microscopy

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SUMMARY Samples of aluminium‐lithium alloys have been observed by scanning ion microscopy and analysed by secondary ion mass spectrometry. The high signal‐to‐noise ratio of the positive secondary lithium ion opens up the possibility of both high resolution imaging and microanalysis of lithium distributions in aluminium and other materials. Some of the problems encountered due to sample preparation are discussed and ion images of both the artefacts and the true lithium distribution are shown.

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Section: Sims a R T E F A C T S I N B U L K Electropolished Specimensmentioning

confidence: 99%