High spatial resolution secondary ion imaging and secondary ion mass spectrometry of aluminium‐lithium alloys

Williams, David B.; Levi‐Setti, R.; Chabala, J. M.; Newbury, Dale E.

doi:10.1111/j.1365-2818.1987.tb02870.x

Cited by 14 publications

(3 citation statements)

References 10 publications

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“…An early attempt was made utilising a laboratory-based SIMS instrument developed at the University of Chicago in collaboration with Hughes Research Laboratories (UC-HRL SIM, USA) to spatially resolve the nanoscale  precipitates that are ~ 100 nm in diameter in an Al-10.7 at. % Li alloy 19,20 . However, the practical implementation of modern commercialised highspatial-resolution SIMS instruments for nanoscale chemical mapping of Li is rarely reported for Al-Li alloys.…”

Section: Main Textmentioning

confidence: 99%

Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Jiao

et al. 2021

Materials Characterization

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Section: Main Textmentioning

confidence: 99%

Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Jiao

et al. 2021

Materials Characterization

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“…The results discussed in this article are based on work performed with the University of Chicago scanning ion microprobe (UC SIM; Levi-Setti et al, 1984, 199 1 ) . The UC SIM provides exceptional spatial resolution and analytical performance; these properties are routinely exploited in the characterization of a wide spectrum of materials (as examples of applications in the materials sciences, see: Chabala et al, 1987;Williams et al, 1987;Lampert et al, 1992). This instrument employs a 40-keV energy, c. 30-pA focused ~a ' primary ion beam extracted from a liquid metal ion source (Prewett & Kellogg, 1985).…”

Section: Capabilities Of Ion Microprobe Analysismentioning

confidence: 99%

Scanning ion microprobe analysis of composite materials

Williams

Soni

Tseng

et al. 1993

Journal of Microscopy

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SUMMARY Applications of scanning ion imaging with high lateral resolution in the microchemical investigation of metal – and ceramic‐matrix composites are described. The technique, which combines a scanning ion microprobe with secondary ion mass spectrometry (SIMS), is ideally suited to the study of complex, multicomponent composite structures. Most elements can be detected with good sensitivity, enabling the determination of spatial distributions for major and minor elements. Analytical images obtained with this technique reveal unprecedented chemical information about interfacial segregation and interdiffusion phenomena. As examples, the characterization of both ceramic–matrix (Al borate–SiC) and metal–matrix (Ni alloy–Al2O3) composite materials is described.

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“…The high resolution imaging capability of the UC-HRL SIM can be fully exploited in this case, as demonstrated in preliminary studies of Al-Li alloys containing up to 12.7 at. % Li [ 4 , 5 ], In these important alloys, the 7 Li + signal is detected with a signal-to-noise ratio ≈ 10 5 , and it is feasible to image and identify grain boundary phases and precipitates in the <100 nm range of dimensions.…”

Section: Imaging Micro-sims Of Aluminum-lithium Alloysmentioning

confidence: 99%

Imaging microanalysis of materials with a finely focused heavy-ion probe

Levi‐Setti¹,

Chabala²,

Wang³

1988

J. RES. NATL. BUR. STAN.

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Scanning Analytical Heavy Ion Microscopy at High Lateral ResolutionLiquid metal ion sources (LMIS) in view of the quasi-point-like geometry of their emitting region and confined emission cone possess brightness (-0I6 A cm 'sr-') which is adequate for the realization of high current density (-I A cm-'), finely focused (>20 rm) probes. A 40 keV scanning ion microprobe, which makes use of a Ga LMIS (UC-HRL SIM) is currently employed in our laboratory to obtain chemical maps of materials in a variety of interdisciplinary applications [1]. The instrument is composed of a two-lens focusing column, a hightransmission secondary ion energy analyzer and transport system, and an RF quadrupole mass filter for secondary ion mass spectrometry (SIMS). in addition, two-channel electron multiplier detectors, overlooking the target region, collect secondary electrons or ions for imaging of the surface topography and material contrast of a sample.Although a lateral resolution of 20 nm has been attained, sensitivity considerations favor operation at somewhat larger (50-70 nmt) probe size. The analytical image resolution is in fact critically dependent on the statistics of the mass analyzed signal [2], which in turn is determined by the rate of material removal by sputtering from the sample surface. Such a rate is proportional to the probe current, which decreases with the square of the probe diameter for chromatic-aberration-limited probes such as those extracted from LMIS. Thus at, e.g., 20 nm probe diameter, only 1-2 pA of probe current are available, the erosion rate is of the order -10-' rnonolayers/s and probe-size resolution can only be attained for elements of high ionization probability which will provide the highest signal statistics over an acceptable recording time (>I count/pixel in a 1024 x 1024 pixel scan for a 512 s acquisition time for the UC-HRL SIM).In view of the well known range of ionization probabilities (ion fractions) among sputtered atomic species, as well as of sputtering yields, the attainable analytical lateral resolution of finely focused probes becomes target-species dependent due to the above considerations. It also follows that for species difficult to ionize, high resolution SIMS imaging microanalysis is altogether precluded, unless by recourse to postionization techniques [3].Two examples of applications of the UC-HRL SIM to the study of materials will be illustrated in the present context. Imaging Micro-SIMS of Aluminum-Lithium AlloysSIMS techniques are uniquely suited to the study of Li because of the intense 'Li' signal emerging from fast ion bombardment of Li-containing materials. The high resolution imaging capability of the UC-HRL SIM can be fully exploited in this case, as demonstrated in preliminary studies of Al-Li alloys containing up to 12.7 at. % Li [4,5]. In these important alloys, the 'Li' signal is detected with a signalto-noise ratio z 10', and it is feasible to image and identify grain boundary phases and precipitates in the <100 nm range of dimensions, Samples of binary Al-Li all...

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High spatial resolution secondary ion imaging and secondary ion mass spectrometry of aluminium‐lithium alloys

Cited by 14 publications

References 10 publications

Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Scanning ion microprobe analysis of composite materials

Imaging microanalysis of materials with a finely focused heavy-ion probe

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