Articles you may be interested inIon and electron bombardment-related ion emission during the analysis of diamond using secondary ion mass spectrometry Alternative method of using an electron beam for charge compensation during ultralow energy secondary-ionmass spectroscopy experiments J. Vac. Sci. Technol. A 24, 953 (2006); 10.1116/1.2201044
Oxygen environmental Auger electron spectroscopy: Eliminating the electron beam effects on Al 2 O 3 during Auger analysisIt is well known that radiolysis, induced by the electron bombardment, leads to different defects in SiO 2 , but little is known about the trapping behavior of these defects. In this article, the charging behavior and the depth profiles of the irradiation damage introduced by electron bombardment are studied with Auger electron spectroscopy ͑AES͒. For charge reduction an environmental AES using O 2 ͑up to 8ϫ10 Ϫ8 Torr͒ and specimen heating are applied. In environmental AES, a strong charge reduction is observed, and the importance of the environment for charge compensation reveals a correlation with electron stimulated desorption. By heating the sample, a strong charge reduction takes place above 500°C; complete charge compensation can be expected by heating the sample above 700°C in an O 2 environment of 5ϫ10 Ϫ8 Torr. We suggest that EЈ centers, nonbridging oxygen hole centers, and peroxy radicals, are responsible for the efficient trapping of electrons. The observed discharging is believed to be related to the annealing of the defects.