Twentieth Annual IEEE Applied Power Electronics Conference and Exposition, 2005. APEC 2005.
DOI: 10.1109/apec.2005.1453338
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Application of press-pack IGBTs in traction refurbishment

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Cited by 10 publications
(2 citation statements)
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“…Therefore, PPIs have been developed in recent years to replace thyristors and gate turn-off thyristors (GTOs) in traction systems [53], [54], large motor drives [55]- [57], power systems [58]- [60], and pulsed power applications [61]. The reliability record for press-pack devices is much higher than power modules largely due to a better tolerance to thermal cycling: the press pack allows double-sided cooling to lower the thermal impedance [56], [62].…”
Section: Package-related Failure Mechanismsmentioning
confidence: 99%
“…Therefore, PPIs have been developed in recent years to replace thyristors and gate turn-off thyristors (GTOs) in traction systems [53], [54], large motor drives [55]- [57], power systems [58]- [60], and pulsed power applications [61]. The reliability record for press-pack devices is much higher than power modules largely due to a better tolerance to thermal cycling: the press pack allows double-sided cooling to lower the thermal impedance [56], [62].…”
Section: Package-related Failure Mechanismsmentioning
confidence: 99%
“…Modules made by these interconnect techniques, which use long and thin conductors to connect to the device's top terminals, are still limited to cooling from the die-attach side of the device chips. To improve package thermal performance, double-side cooled modules have been introduced, such as the metal-postinterconnected parallel-plate structure [13], flip-chip-on-flex [14], dimple array [15], embedded power [16], [17], silicon interposer [18], solder bump [19], metal bump [20]- [23], flip chip [24], power overlay [25], [26], and press pack [27]- [29]. All of these package structures have a common feature, i.e., the device chips are sandwiched between two electrically and thermally conductive substrates, one for die attach and the other for top-terminal interconnection.…”
Section: Introductionmentioning
confidence: 99%