The polarization hysteresis and current leakage characteristics of
bismuth ferrite, BiFeO3 (BFO) thin films deposited by pulsed laser
deposition was measured while varying the temperature from 80 - 300 K in
increments of 10 K, to determine the feasibility of BFO for capacitive
applications in memory storage devices. Data is compared to the performance
of prototypic ferroelectric barium strontium titanate, BaxSr1-xTiO3 (BST)
under similar conditions. Finding contacts on the BFO samples that exhibited
acceptable dielectric properties was challenging; and once identified, the
polarization characteristics between them varied greatly. However, the
non-uniformity among the contact points within each sample suggests that
either the samples were defective (by contamination or growth process), or
that the deposition process of the contacts may have undermined the
functionality of the devices. Subjected to increasing temperatures, BFO's
polarization improved, and though its polarizability was shown to be
inferior to BST, the dielectric loss was less.