Applications of SIMS to cultural heritage studies

Adriaens, Annemie; Dowsett, Mark

doi:10.1016/j.apsusc.2006.02.127

Cited by 30 publications

(13 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…For example, secondary ion mass spectrometry (SIMS) can attain spatial resolutions on the order of 45 10-50 nm for elemental analysis, and has also been extended to some organic colorants as well. 3,4 Due to the inherent fragmentation of organics with SIMS, many organic pigments that have similar molecular weights or structures can be difficult to distinguish from each other. Scanning electron 50 microscopy/energy dispersive X-ray spectroscopy (SEM-EDS) provides high spatial resolution, but being an elemental analysis technique it is better suited to the identification of inorganic species than organic components.…”

Section: Introductionmentioning

confidence: 99%

Sub-micron proximal probe thermal desorption and laser mass spectrometry on painting cross-sections

et al. 2014

View full text Add to dashboard Cite

We demonstrate sub-micron, atomic force microscopy (AFM) proximal probe desorption of organic dyes, and subsequent detection via laser mass spectrometry. A nanothermal analysis (nano-TA) probe tip in contact with a surface is heated (1000 °C/sec) to induce thermal desorption, creating depression sizes ranging from 360-1500 nm in diameter and 20-100 nm in depth. Desorbed material is drawn through a heated capillary via vacuum, and deposits onto a graphite sample bar. Laser desorption, followed by supersonic jet-cooling and either resonant two-photon ionization (R2PI) or non-resonant ionization mass spectrometry is used to characterize the transferred 10 material. Individual, microscopic layers of organic dyes within painting cross-sections were successfully analyzed using this new approach. Separating the AFM thermal desorption step from the detection step allows for the use of analytical techniques appropriate for individual samples of material, desorbed with high spatial resolution.

show abstract

Section: Introductionmentioning

confidence: 99%

Sub-micron proximal probe thermal desorption and laser mass spectrometry on painting cross-sections

et al. 2014

View full text Add to dashboard Cite

show abstract

“…Secondary ion mass spectrometry (SIMS) is a destructive analysis technique that has already been used to determine the elemental composition of museum artifacts [14][15][16][17][18]. SIMS is an ultra-high vacuum technique and the quality of data depends on the quality of vacuum over the sample.…”

Section: Fib-sims Analysismentioning

confidence: 99%

Laser Cleaning of Excavated Greco-Roman Glass: Removal of Burial Encrustation and Corrosion Products

Elnaggar¹,

Mohamed²,

Mahgoub³

et al. 2010

Studies in Conservation

View full text Add to dashboard Cite

The potential of using laser-assisted cleaning for the removal of burial encrustation and corrosion products on Egyptian glass fragments (from between 332 bce and 395 ce) excavated from Sinai (Egypt) using a 10 nanosecond Q-switched Nd:YAG laser operating at 1064 nm has been assessed. A series of complementary analytical techniques including microscopy, Fourier transform infrared spectroscopy, static secondary ion mass spectrometry with a focused ion beam and scanning electron microscopy coupled with an energy-dispersive X-ray spectrometer were employed to characterize the glass deterioration phenomena. Following the optimization of laser cleaning parameters, results suggest that laser cleaning successfully removes both the burial encrustation and degradation products, without damage to the underlying glass substrate.ÖZET Mısır Sinai'deki kazılarda bulunan antik cam parçaları üzerindeki korozyon ve gömü ortamı yüzünden oluşan kabuklanmaları temizlemek için lazer yöntemi (10 nanosaniye, Q-switched Nd:YAG lazer, 1064 nm) denenmiştir. Camın bozulma sebeplerini tanımlamak için, bir çok analitik teknik (mikroskopi, Fourier-Dönüşümlü Kızıl Ötesi Spektroskopi, Odaklanmış iyon ışınlı statik ikincil iyon kütle spektrometresi, ve enerji dağıtıcı X-ray spektrometresi ile birleştirilmiş tarama elektron mikroskobu) kullanılmıştır. Lazerle temizleme parametrelerinin uygunlaştırma yöntemlerini takiben alınan sonuçlar lazer tekniğinin, gömü ortamı sebebiyle oluşan kabuklanmayı ve bozulmayı, camın kendisine zarar vermeden başarılı bir şekilde temizlediğini kanıtlamıştır.

show abstract

“…In particular, laser induced breakdown spectroscopy (LIBS [1]), secondary ion mass spectrometry (SIMS [2], electron probe X-ray microanalysis (EPXMA see, e.g. [3]) ion beam analytical techniques (IBA) like proton induced X-ray emission and proton induced gamma-ray emission (PIXE and PIGE [4]), neutron activation analysis (NAA methods [5][6][7]) were all employed for the characterization of both major, minor and trace element amounts (see also [8,9]).…”

Section: Introductionmentioning

confidence: 99%

Role of laser ablation–inductively coupled plasma–mass spectrometry in cultural heritage research: A review

Giussani

Monticelli

Rampazzi

2009

Analytica Chimica Acta

106

View full text Add to dashboard Cite

Applications of SIMS to cultural heritage studies

Cited by 30 publications

References 16 publications

Sub-micron proximal probe thermal desorption and laser mass spectrometry on painting cross-sections

Sub-micron proximal probe thermal desorption and laser mass spectrometry on painting cross-sections

Laser Cleaning of Excavated Greco-Roman Glass: Removal of Burial Encrustation and Corrosion Products

Role of laser ablation–inductively coupled plasma–mass spectrometry in cultural heritage research: A review

Contact Info

Product

Resources

About