2017
DOI: 10.1155/2017/2323082
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Applying Two-Stage Neural Network Based Classifiers to the Identification of Mixture Control Chart Patterns for an SPC-EPC Process

Abstract: The effective controlling and monitoring of an industrial process through the integration of statistical process control (SPC) and engineering process control (EPC) has been widely addressed in recent years. However, because the mixture types of disturbances are often embedded in underlying processes, mixture control chart patterns (MCCPs) are very difficult for an SPC-EPC process to identify. This can result in problems when attempting to determine the underlying root causes of process faults. Additionally, a… Show more

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Cited by 12 publications
(11 citation statements)
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“…The setting Energies 2018, 11, 1848 9 of 22 values of hidden nodes were from (2i − 2) to (2i + 2), where i is the number of input variables. Since the learning rate of 0.01 is a very effective setting [16,45], this study used the learning rate value of 0.01 for ANN modeling. Moreover, since MAPE is one of the most important performance measurements of forecasting capability, the smallest MAPE was used as the criterion for selecting the ANN topology.…”
Section: Forecasting Results For Industrial Electricity (Ie) Salesmentioning
confidence: 99%
“…The setting Energies 2018, 11, 1848 9 of 22 values of hidden nodes were from (2i − 2) to (2i + 2), where i is the number of input variables. Since the learning rate of 0.01 is a very effective setting [16,45], this study used the learning rate value of 0.01 for ANN modeling. Moreover, since MAPE is one of the most important performance measurements of forecasting capability, the smallest MAPE was used as the criterion for selecting the ANN topology.…”
Section: Forecasting Results For Industrial Electricity (Ie) Salesmentioning
confidence: 99%
“…Observing Table 4; Table 5, one can notice that the AIR values were higher for the cases of ρ = 0.5 and ρ = 0.8. For the SVM classification design, the performance is affected by the values of two parameters, C and γ [45,46]. There are no general rules for the choice of C and γ.…”
Section: Mnp 5 Mnpmentioning
confidence: 99%
“…While most studies have focused on the use of ANN and SVM classifiers for CCP recognition, extreme learning machine (ELM) techniques have been used to identify MCCPs for a process [17,18]. The multivariate adaptive regression splines (MARS) scheme was also applied to the recognition of MCCPs for an SPC and engineering process control (EPC) process [19,20].…”
Section: Introductionmentioning
confidence: 99%