2020
DOI: 10.1103/physrevlett.125.080501
|View full text |Cite
|
Sign up to set email alerts
|

Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification

Abstract: Weak value amplification (WVA) is a metrological protocol that amplifies ultra-small physical effects. However, the amplified outcomes necessarily occur with highly suppressed probabilities, leading to the extensive debate on whether the overall measurement precision is improved in comparison to that of conventional measurement (CM). Here, we experimentally demonstrate the unambiguous advantages of WVA that overcome practical limitations including noise and saturation of photo-detection and maintain a shot-noi… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
36
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 65 publications
(37 citation statements)
references
References 41 publications
(37 reference statements)
1
36
0
Order By: Relevance
“…The uncertainty in the meter is determined as the standard deviation σ ν for ν times measurement of p √ . The achieved precision is defined as the ratio of σ ν and s, and the results shown in Figure 7a are consistent with the theoretical prediction in Equation (26). The amount of extracted Fisher information (FI) for different n. The n 2 scaling also indicates that the Heisenberg limit is approached in this measurement.…”
Section: Heisenberg Scaling Wm Protocol By Measuring the Post-selectisupporting
confidence: 83%
See 1 more Smart Citation
“…The uncertainty in the meter is determined as the standard deviation σ ν for ν times measurement of p √ . The achieved precision is defined as the ratio of σ ν and s, and the results shown in Figure 7a are consistent with the theoretical prediction in Equation (26). The amount of extracted Fisher information (FI) for different n. The n 2 scaling also indicates that the Heisenberg limit is approached in this measurement.…”
Section: Heisenberg Scaling Wm Protocol By Measuring the Post-selectisupporting
confidence: 83%
“…Other practical factors may also confer WM the ability to outperform CM, e.g., when detector saturation occurs, WM maintains a considerable amount of metrology information while detecting an ultra-small fraction of probes. Vaidman proposed the conjecture about this advantage [24], which was then rigorously verified in theory [25] and demonstrated in experiment [26].…”
Section: Standard-quantum-limited Wm Protocolsmentioning
confidence: 85%
“…Based on this point, Vaidman conjectured that SWM can effectively alleviate DSE and outperform CM with incident photon number above the saturation threshold of detectors 33 . Recently, several theoretical and experimental studies have confirmed this advantage of SWM and proved that SWM offers an improved precision compared to CM in the presence of DSE 34 .…”
Section: Introductionmentioning
confidence: 90%
“…SWM satisfies these two premises by increasing the strength of post-selection, and eventually, an improved precision can be acquired 35 . In an ideal case, a stronger postselection in SWM necessarily results in a larger factor of amplification; however, in practice, this simple postselection cannot be arbitrarily strong, and SWM can only alleviate DSE to a limited extent 34 . By contrast, biased weak measurement (BWM) employs an additional reduction of photons in the post-selection by introducing a pre-coupling, and the remaining photons have shown to be extremely sensitive to the estimated parameter both in theory and experiments [36][37][38] .…”
Section: Introductionmentioning
confidence: 99%
“…Actually, theoretical analysis has pointed out that the WVA technique can outperform conventional measurement in the presence of detector saturation [18]. This advantage of the WVA technique was recently illustrated by achieving a precision of 6 times higher than that of the conventional measurement [19]. Other improvements along the line of the WVA technique include such as strengthening the WVA via photon recycling [20][21][22] and applying a technique called dual WVA (DWVA) which allows for a precision metrology with sensitivity several orders of magnitude higher than the standard approach [23].…”
Section: Introductionmentioning
confidence: 99%