2021
DOI: 10.1038/s41377-021-00543-4
|View full text |Cite
|
Sign up to set email alerts
|

Improving the precision of optical metrology by detecting fewer photons with biased weak measurement

Abstract: In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especially when the detector response is dominated by the saturation effect. In this work, we show that a modified weak measurement protocol, namely, biased weak measurement significantly improves the precision of optical metrology… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 27 publications
(7 citation statements)
references
References 38 publications
0
7
0
Order By: Relevance
“…The most sensitivity relationship between Kerr signals and the pointer shift depends on finding the most appropriate post-selection state. It is very important to go beyond this and design a new scheme based on the weak-value-amplification technique [73,30,74,36]. Particularly, the article [73] experimentally verified that biased weak measurement significant improves the precision of optical metrology with a scheme to measure a small optical delay, where the estimated parameter (corresponding to the small optical delay) was amplified as the parameter in the "weak-coupling" progress in the standard weak-value-amplification technique.…”
Section: Summary and Discussionmentioning
confidence: 92%
“…The most sensitivity relationship between Kerr signals and the pointer shift depends on finding the most appropriate post-selection state. It is very important to go beyond this and design a new scheme based on the weak-value-amplification technique [73,30,74,36]. Particularly, the article [73] experimentally verified that biased weak measurement significant improves the precision of optical metrology with a scheme to measure a small optical delay, where the estimated parameter (corresponding to the small optical delay) was amplified as the parameter in the "weak-coupling" progress in the standard weak-value-amplification technique.…”
Section: Summary and Discussionmentioning
confidence: 92%
“…First, if we set the same intensity of the Laser in the two schemes, naturally the value of 𝜅 equals 2 due to the beam split of the OC1. However, the value of 𝜅 could be one when the PD is dominated by the saturation effect [43]. Note that the different values of 𝜅 will not influence the pointer shifts (corresponding to the sensitivity) but have an effect on the calculation of SNR.…”
Section: A Pre-selection For the System And The Pointermentioning
confidence: 99%
“…In 2005 and 2007, the teams of Pryde and Jozsa realized and measured complex weak values in polarization detection based on the weak measurement theory and explained in detail the physical significance of the weak values in both the real and imaginary parts of the actual measurement ( Pryde et al, 2005 ; Jozsa, 2007 ). With this approach, it was possible to achieve high precision measurement with weak measurement technology ( Xu et al, 2013 ; Vella et al, 2019 ; Xu et al, 2020 ; Yin et al, 2021 ). Since 2010, relevant theories have shown that the weak measurement technology exhibits more obvious detection advantages in the frequency domain than the other fields ( Brunner and Simon, 2010 ; Xu et al, 2013 ).…”
Section: Introductionmentioning
confidence: 99%