1985
DOI: 10.1103/physrevb.31.8097
|View full text |Cite
|
Sign up to set email alerts
|

Arc-evaporated carbon films: Optical properties and electron mean free paths

Abstract: The real and imaginary parts of the complex refractive index, n(~)=n{co)+ik(m), of arcevaporated carbon films have been obtained over the range of photon energies fin from 0.5 to 62.0 eV. Values of k {~)obtained from transmission measurements in this energy range were combined with values of k(co) from the literature in the infrared and soft-x-ray regions. A Kramers-Kronig analysis then yielded the values of n (co). The density of the arc-evaporated carbon films was found to be 1.90+0.05 g cm by the "sink-floa… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
14
0

Year Published

1994
1994
2016
2016

Publication Types

Select...
5
3
1

Relationship

0
9

Authors

Journals

citations
Cited by 43 publications
(14 citation statements)
references
References 15 publications
0
14
0
Order By: Relevance
“…For this reason, a model containing three uniaxial layers with optical axes parallel to the substrate surface was used to describe the optical properties of the substrates (Si/SiO 2 /CNT). As previously reported, the dielectric functions of the substrates were described by a layer of Si (bulk, d = 1 mm), a layer of native SiO 2 (d = 2.5 ± 0.5 nm), and a two-media Maxwell-Garnett effective medium approximation (EMA)49 layer (d = 25 ± 5 nm) consisting of 98% void and 2% arc-evaporated carbon 50. The thickness value of the CNT layer calculated by the optical model was verified by performing atomic force microscopy and scanning electron microscopy on the selected substrates 51…”
Section: Resultsmentioning
confidence: 99%
“…For this reason, a model containing three uniaxial layers with optical axes parallel to the substrate surface was used to describe the optical properties of the substrates (Si/SiO 2 /CNT). As previously reported, the dielectric functions of the substrates were described by a layer of Si (bulk, d = 1 mm), a layer of native SiO 2 (d = 2.5 ± 0.5 nm), and a two-media Maxwell-Garnett effective medium approximation (EMA)49 layer (d = 25 ± 5 nm) consisting of 98% void and 2% arc-evaporated carbon 50. The thickness value of the CNT layer calculated by the optical model was verified by performing atomic force microscopy and scanning electron microscopy on the selected substrates 51…”
Section: Resultsmentioning
confidence: 99%
“…-* transitions near 3.5 eV and a broad distribution of -* transitions centred at 15 eV. The latter reminds of the  2 (E) spectrum of graphite for in-plane polarization [44] and that of arc-evaporated a-C (1.90 g.cm -3 ) [45] ; the presence of a plasmon at 6.5 eV (Fig. 7) indicates that some ordered sp 2 -bonding is present in sputtered a-C ;…”
Section: Dielectric Functionmentioning
confidence: 90%
“…36,37 PANI was treated as an isotropic dielectric material. The FDTD simulations were carried out with the commercial software FDTD Solutions 8.5 (Lumerical Solutions).…”
Section: Electrodynamic Simulationsmentioning
confidence: 99%