2023
DOI: 10.1021/acsanm.2c04620
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Area-Selective Atomic Layer Deposition of SnS2 Nanosheets for Applications of Back-End-of-Line-Compatible Transistors

Abstract: As semiconductor devices are miniaturized (to dimensions of nanometers), the accurate alignment of each layer on the desired location poses a challenge in the fabrication of multilayer-stacked devices. Area-selective deposition has attracted interest in resolving alignment issues in nanoelectronics. Herein, we demonstrate the area-selective atomic layer deposition (ALD) of SnS2, a promising two-dimensional channel material for the application of back-end-of-line (BEOL)-compatible transistors, on SiO2 (growth a… Show more

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Cited by 3 publications
(1 citation statement)
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“…Chen et al reported the direct synthesis of semiconducting PtSe2 layers at 450 • C [1016] and metallic PdSe2 layer at 300 • C [1017] on SOI to fabricate phototransistors, in which the top Si layer and the 2D layers as photoactive channel and the gate bias was applied to the bottom Si layer of the SOI. In addition, other 2D materials such as WSe2 [1018], SnS2 [1019], PdS2 [1020], PdSe2 [1021], and more have also achieved low-temperature growth compatible with BEOL through various methods. It is worth noting that besides the transfer and synthesis processes, other operations for integrating 2D materials with silicon also need to meet BEOL compatibility conditions.…”
Section: Heterogeneous Integration With Siliconmentioning
confidence: 99%
“…Chen et al reported the direct synthesis of semiconducting PtSe2 layers at 450 • C [1016] and metallic PdSe2 layer at 300 • C [1017] on SOI to fabricate phototransistors, in which the top Si layer and the 2D layers as photoactive channel and the gate bias was applied to the bottom Si layer of the SOI. In addition, other 2D materials such as WSe2 [1018], SnS2 [1019], PdS2 [1020], PdSe2 [1021], and more have also achieved low-temperature growth compatible with BEOL through various methods. It is worth noting that besides the transfer and synthesis processes, other operations for integrating 2D materials with silicon also need to meet BEOL compatibility conditions.…”
Section: Heterogeneous Integration With Siliconmentioning
confidence: 99%