1992
DOI: 10.1051/mmm:0199200305040100
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Abstract: Introduction.

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Cited by 11 publications
(5 citation statements)
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“…The (011) orientation of Ni layers electrodeposited on GaAs(001) had been reported previously [17,20]. Here we find a mixture of Ni(001) and Ni(011) with, considering the substantially larger rocking curve width for Ni(001), dominantly Ni(001).…”
Section: Structural Propertiessupporting
confidence: 83%
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“…The (011) orientation of Ni layers electrodeposited on GaAs(001) had been reported previously [17,20]. Here we find a mixture of Ni(001) and Ni(011) with, considering the substantially larger rocking curve width for Ni(001), dominantly Ni(001).…”
Section: Structural Propertiessupporting
confidence: 83%
“…This was confirmed by in-plane XRD, where two preferred epitaxial growth relationships were observed. Figure 3 electrodeposited NiCu [17] and Cu [28] on GaAs(001). It should be noted that the Ni(001) orientation does not have any [111] in-plane direction; however, the (022) orientation does.…”
Section: Structural Propertiesmentioning
confidence: 99%
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“…This result is in good agreement with reported literature using galvanostatic electrodeposition to grow Ni thin film on GaAs. [ 30–33 ]…”
Section: Resultsmentioning
confidence: 99%
“…This result is in good agreement with reported literature using galvanostatic electrodeposition to grow Ni thin film on GaAs. [30][31][32][33] It should be noted that, with Si substrates, the formation of a metallic deposit on Si results spontaneously in the formation of a thin oxide layer, [8] thus forming a MIS junction. At the GaAs substrate however, no such oxide is formed due to the dissolution of GaAs during the deposition of Ni.…”
Section: Self-limiting Electrodeposition Of Continuous Ni Thin Film Omentioning
confidence: 99%