Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces

Uluutku, Berkin; Baykara, Mehmet Z.

doi:10.1116/1.4915898

Cited by 4 publications

(3 citation statements)

References 36 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The topographical map (b) is in good agreement with the SEM image and the electrochemical maps (c and d). The slight offset between the topography map and electrochemical images is attributed to some asymmetry in the tip geometry . The electrochemical maps show a clear increase in tip current (hydrogen oxidation) over the Au nanocrystal, with a diffusional decay in the region beyond, indicating the higher activity of the Au substrate for HER.…”

Section: Resultsmentioning

confidence: 96%

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

et al. 2020

View full text Add to dashboard Cite

The requirement to separate topographical effects from surface electrochemistry information is a major limitation of scanning electrochemical microscopy (SECM). With many applications of SECM involving the study of (semi)conducting electrode surfaces, the hybridisation of SECM with scanning tunnelling microscopy (STM) or a surface conductance probe would provide the ultimate topographical imaging capability to SECM, but previous attempts are limited. Here, the conversion of a general scanning electrochemical probe microscopy (SEPM) platform to facilitate contact electrical conductance (C)‐ and electron tunnelling (T)‐SECM measurements is considered. Measurements in air under ambient conditions with a Pt/Ir wire tip are used to assess the performance of the piezoelectric positioning system. A hopping‐mode imaging protocol is implemented, whereby the tip approaches the surface at each pixel until a desired current magnitude is exceeded, and the corresponding z position (surface height) is recorded at a set of predefined xy coordinates in the plane of the surface. At slow tip approach rates, the current shows an exponential dependence on tip‐substrate distance, as expected for electron tunnelling. For measurements in electrochemical environments, in order to overcome well‐known problems with leakage currents at coated‐wire tips used for electrochemical STM, Pt‐sensitised carbon nanoelectrodes are used as tips. The hydrogen evolution reaction on 2D Au nanocrystals serves as an exemplar system for the successful simultaneous mapping of topography and electrochemical activity.

show abstract

Section: Resultsmentioning

confidence: 96%

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

et al. 2020

View full text Add to dashboard Cite

show abstract

“…This ability allows for atom-specific-force mapping with piconewton and picometer resolution [ 1 , 2 ]. Because experimental LFM measurements are affected by interatomic interactions between the probe tip and the sample surface [ 3 ], the tip features, including its stiffness [ 4 ], asymmetry [ 5 , 6 ], apex structure [ 7 , 8 ], and chemical identity [ 9 , 10 ], are important in lateral-force imaging of surfaces and the characterization of frictional behaviors at the atomic scale. In general, scanning-probe microscopy/LFM measurements are thought to be more accurate with a sharper tip [ 11 , 12 ].…”

Section: Introductionmentioning

confidence: 99%

Characterization of Frictional Properties of Single-Layer Molybdenum-Disulfide Film Based on a Coupling of Tip Radius and Tip–Sample Distance by Molecular-Dynamics Simulations

Pang

Gao

et al. 2018

Nanomaterials

View full text Add to dashboard Cite

Lateral-force microscopy is a powerful tool to study the frictional properties of two-dimensional materials. However, few works distinctly reveal the correlation between the tip radius with the tip–sample distance and the frictional properties of the two-dimensional (2D) materials. We performed molecular-dynamics simulations to study the atomic-scale friction of a typical two-dimensional single-layer molybdenum disulfide (SLMoS2). The effects of tip radius and tip–sample distance on the frictional properties were analyzed and discussed. The frictional force–sliding-distance curves show typical stick–slip behaviors, and the periodicity can be used to characterize the lattice constants of SLMoS2. Sub-nanoscale stick-slip movements occur in one-lattice sliding periods along with only the armchair (AC) direction and only when the tip radius is smaller than 3 Å with 1.47 Å tip-sample distance. At the same tip–sample distance, a smaller tip can provide a more detailed characterization and higher-precision frictional properties of SLMoS2. A larger tip is capable of providing comparative frictional properties of SLMoS2 at a proper vertical tip–sample distance, compared with the small tip.

show abstract

“…Since the atomic force microscope (AFM) was first developed in 1986, 1) it has been widely accepted as a versatile and useful tool for the atomic-scale imaging of conducting and insulating surfaces due to its excellent ability of recording tip-sample force interactions and atom-specific-force imaging with picometer and piconewton resolution in recent years. [2][3][4] On account of the fact that AFM experiments are strongly influenced by the interatomic interactions between the sample surface and the probe tip, 5) the tip features, such as its apex structure, 6,7) asymmetry, 8,9) and chemical identity, 10) are significant in obtaining imaging features with the atomic resolution. In general, sample topography recorded by an AFM is considered to be more exquisite with a sharper tip.…”

Section: Introductionmentioning

confidence: 99%

Improving the atomic-resolution AFM imaging of monolayer MoS₂for worn tips: a molecular dynamics study

Zhuo

Pang

et al. 2019

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

In this paper, molecular dynamics simulations were performed to investigate the atomic-scale imaging of a typical two-dimensional monolayer: molybdenum disulfide (MoS 2 ). With a constant height mode, force-displacement curves of tips along a straight-line scanning path indicate resonant waveforms and the periodicities are capable of characterizing lattice parameters of monolayer MoS 2 . Some characteristic sites in the forcedisplacement curves arise only for tips with a radius of less than 3 Å under 1.47 Å tip-sample distance, which correlated to the atoms next to the scanning path. Such characteristic sites can be reproduced by using tips with a radius of 7 Å via increasing the tip-sample distance. The underlying mechanism was illustrated by the number of interactive atoms between the tip and the sample. The work may shed light on the atomic force microscope (AFM) operation when one expects to achieve high-resolution AFM imaging of 2D materials with a worn AFM tip.

show abstract

Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces

Cited by 4 publications

References 36 publications

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

Characterization of Frictional Properties of Single-Layer Molybdenum-Disulfide Film Based on a Coupling of Tip Radius and Tip–Sample Distance by Molecular-Dynamics Simulations

Improving the atomic-resolution AFM imaging of monolayer MoS₂for worn tips: a molecular dynamics study

Contact Info

Product

Resources

About

Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces

Cited by 4 publications

References 36 publications

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

Characterization of Frictional Properties of Single-Layer Molybdenum-Disulfide Film Based on a Coupling of Tip Radius and Tip–Sample Distance by Molecular-Dynamics Simulations

Improving the atomic-resolution AFM imaging of monolayer MoS2for worn tips: a molecular dynamics study

Contact Info

Product

Resources

About

Improving the atomic-resolution AFM imaging of monolayer MoS₂for worn tips: a molecular dynamics study