2005
DOI: 10.1557/jmr.2005.0365
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Assessment of Chemical Solution Synthesis and Properties of Gd2Zr2O7 Thin Films as Buffer Layers for Second-Generation High-Temperature Superconductor Wires

Abstract: Chemical solution processing of Gd 2 Zr 2 O 7 (GZO) thin films via sol-gel and metalorganic decomposition (MOD) precursor routes have been studied on textured Ni-based tape substrates. Even though films processed by both techniques showed similar property characteristics, the MOD-derived samples developed a high degree of texture alignment at significantly lower temperatures. Both precursor chemistries resulted in exceptionally dense, pore-free, and smooth microstructures, reflected in the cross-sectional and … Show more

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Cited by 22 publications
(9 citation statements)
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“…Similar voids have been reported previously in La 2 Zr 2 O 7 buffer layers grown by chemical solution deposition [10]. However, no voids were reported in chemically solution processed GZO films deposited using sol-gel and metal-organic decomposition precursor routes [11]. Voids are important because they can act as accelerated pathways for metal or oxygen diffusion, therefore degrading the superconductor properties.…”
Section: Resultssupporting
confidence: 75%
“…Similar voids have been reported previously in La 2 Zr 2 O 7 buffer layers grown by chemical solution deposition [10]. However, no voids were reported in chemically solution processed GZO films deposited using sol-gel and metal-organic decomposition precursor routes [11]. Voids are important because they can act as accelerated pathways for metal or oxygen diffusion, therefore degrading the superconductor properties.…”
Section: Resultssupporting
confidence: 75%
“…16 Although the precursors, lms thicknesses and annealing procedures are the key factors in determining the texture quality of the CSD-buffer layer, there are seemingly no signicant microstructural differences among rare-earth zirconate layers, especially for the thick lms prepared by mono-coating routes. Additionally, the microstructure of the barrier plays an essential role in preventing the diffusion of metal elements from the substrate.…”
Section: Resultsmentioning
confidence: 99%
“…[5][6][7][8] The successful growth of epitaxial Gd 2 Zr 2 O 7 (GZO) and Gd 2 O 3 (GO) by solution techniques has also been reported. 9,10 In this paper, we report on high-quality biaxially textured buffer layers with improved full-width at half maximum values of the omega and phi scans compared with the base Ni-W substrate, prepared inexpensively by an electrodeposition method. YBCO tapes prepared using this type of buffer layer produced pulsed-laser deposited (PLD) YBCOcoated conductor with J c of 3.3 · 10 6 A/cm 2 at 77 K in zero field.…”
Section: Introductionmentioning
confidence: 99%