2005
DOI: 10.1128/aem.71.2.955-960.2005
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Assessment of Elasticity and Topography of Aspergillus nidulans Spores via Atomic Force Microscopy

Abstract: Previous studies have described both surface morphology and adhesive properties of fungal spores, but little information is currently available on their mechanical properties. In this study, atomic force microscopy (AFM) was used to investigate both surface topography and micromechanical properties of Aspergillus nidulans spores. To assess the influence of proteins covering the spore surface, wild-type spores were compared with spores from isogenic rodA ؉ and rodA ؊ strains. Tapping-mode AFM images of wild-typ… Show more

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Cited by 61 publications
(36 citation statements)
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“…An important requirement for AFM investigations is that the sample be immobilized on a surface. For this purpose, an aliquot of bacterial suspension of ϳ10 5 cells per ml was allowed to adhere through electrostatic interactions to a very thin layer of poly-L-lysine on a glass substrate that was prepared as previously described (57). After 15 min, the bacterium-coated glass substrate was rinsed with deionized water to remove loosely attached bacteria and then transferred to the AFM for immediate measurement.…”
Section: Methodsmentioning
confidence: 99%
“…An important requirement for AFM investigations is that the sample be immobilized on a surface. For this purpose, an aliquot of bacterial suspension of ϳ10 5 cells per ml was allowed to adhere through electrostatic interactions to a very thin layer of poly-L-lysine on a glass substrate that was prepared as previously described (57). After 15 min, the bacterium-coated glass substrate was rinsed with deionized water to remove loosely attached bacteria and then transferred to the AFM for immediate measurement.…”
Section: Methodsmentioning
confidence: 99%
“…Recently, atomic force microscopy (AFM) has emerged as a valuable tool that can be used not only to image the surface topography of a sample under physiological conditions but also to locally measure the mechanical properties of the material itself (15,28,34). To this end, force-indentation curves are commonly measured; these represent the relationship between the loading force and the depth of the indentation as the tip at the end of the AFM cantilever pushes onto the sample surface.…”
mentioning
confidence: 99%
“…Digital image analysis systems run with powerful software packages that permit fully automated work and statistical evaluation of the measured data [10,11]. Recently, confocal laser scanning microscopy (CLSM) and fluorescence microscopy have been employed successfully in fungal morphology studies offering precise structural analysis of the mycelium and spores [12][13][14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%