Defects in complex multilayered thin-film solar cells are often analyzed by capacitance-based techniques, which originally were developed for simple homojunctions in single-crystal bulk semiconductors. We discuss the impact of a capacitive and conductive buffer layer on the impedance and capacitance spectra of thin-film solar cells. While the resulting capacitance spectra are indistinguishable from those caused by a deep defect level, the buffer layer and p-n junction can clearly be distinguished in the experimental impedance spectra. Exploiting bias voltage and illumination as additional experimental parameters allows us to test a given hypothesis-deep defect or buffer layer-to explain characteristic capacitance steps in thermal admittance spectroscopy of thin-film solar cells. We address the controversial origin of the N1 signature commonly observed in admittance spectroscopy of CuðIn; GaÞSe 2 solar cells. The circuit element dominantly defining the main capacitance step in our devices is unaffected by applied bias voltage, and its conductivity increases linearly with illumination intensity. We conclude that the main capacitance step in our devices is most plausibly explained by the presence of a buffer layer connected in series to the p-n junction of the device and is not related to any deep defects or mobility freeze-out.