2002
DOI: 10.1002/xrs.548
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Atmospheric particulate analysis by synchrotron radiation total reflection (SR‐TXRF)

Abstract: X-ray fluorescence with synchrotron radiation total reflection was used to analyze the atmospheric particulate collected in Campinas, SP, Brazil, in fine and coarse fractions, using a stacked filter unit. After treatment with acid solution and pipetting on to Perspex disks, the samples were measured at the x-ray fluorescence beamline at the National Synchrotron Light Laboratory (LNLS), Campinas, using a polychromatic beam for sample excitation. The detection limits obtained ranged from 0.3 to 8.9 ng m −3 for t… Show more

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Cited by 19 publications
(19 citation statements)
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“…The MDL was calculated by Eqn () LMDimgnormall1=3Ii.()BGtCyIy.SitalicRiwhere l i is the signal intensity of element i in the sample, I y is the signal intensity of the internal standard ( Y ) in the sample, C y is the concentration of the internal standard ( Y ) in the sample, S Ri is the relative sensitivity for element i , BG corresponds to the background signal intensity (counts per second), and t is time in seconds.…”
Section: Resultsmentioning
confidence: 99%
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“…The MDL was calculated by Eqn () LMDimgnormall1=3Ii.()BGtCyIy.SitalicRiwhere l i is the signal intensity of element i in the sample, I y is the signal intensity of the internal standard ( Y ) in the sample, C y is the concentration of the internal standard ( Y ) in the sample, S Ri is the relative sensitivity for element i , BG corresponds to the background signal intensity (counts per second), and t is time in seconds.…”
Section: Resultsmentioning
confidence: 99%
“…The key elements for each source were determined on the basis of data from the literature . On the basis of the elemental concentrations of the two fractions and on the values obtained for each element in the factor loadings matrices, we can calculate the contribution of each emission source to the formation of the CPM and FPM fractions.…”
Section: Resultsmentioning
confidence: 99%
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“…A high-resolution and highefficiency Si(Li) or HPGe detector may be employed. Typical detection limits (DL) calculated on the basis of three times the square root of the background are listed in Table 9 [45,46]. EDXRF spectrometers, also in the form of portable equipment, have been also widely employed to analyze water (rain water, drinking water, mineral water, polluted water), generally in the form of dry residues [46][47][48][49].…”
Section: Environmental Samplesmentioning
confidence: 99%