Atmospheric-Pressure Argon Surface-Wave Plasma (SWP) as an Ion Source in Elemental Mass Spectrometry

Boudreau, Denis; Hubert, J.

doi:10.1366/0003702934067234

Cited by 14 publications

(3 citation statements)

References 22 publications

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“…Generator Several attempts to use the MIP for the analysis of aqueous A microwave generator with a working frequency of 2450 MHz aerosols have been reported. 4,8,9,12,[17][18][19]26,[28][29][30][31][32][33][34][35][36][37][38] To date, a was used. The power supply provides a maximum power of serious problem has been the ineÃcient introduction of the 800 W. The maximum power could be used only in short-term aerosols into the plasma zone, since in contrast to the ICP mode because of overheating problems.…”

mentioning

confidence: 99%

Characterisation of a Microwave-induced Plasma Atomic Emission Spectrometry System Using a Modified Plasma Torch Coupled With Pneumatic and Hydraulic High-pressure Nebulization

Geiger¹,

Kirschner²,

Ramacher³

et al. 1997

J. Anal. At. Spectrom.

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mentioning

confidence: 99%

Characterisation of a Microwave-induced Plasma Atomic Emission Spectrometry System Using a Modified Plasma Torch Coupled With Pneumatic and Hydraulic High-pressure Nebulization

Geiger¹,

Kirschner²,

Ramacher³

et al. 1997

J. Anal. At. Spectrom.

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“…The surface wave launching devices [6][7][8] are also used and, more recently, work has started with new devices like the microwave plasma torch (MPT) [9]. Although some work was done several years ago with high power plasmas [10,11], it is only during the last years that substantial developments of such plasma sources have begun [12].…”

Section: Microwave Plasma Sourcesmentioning

confidence: 99%

“…Most of the studies on the mixed gas plasmas have been done by using a high power surfatronguide launcher [12]. This device allows the production of plasmas up to 1.5 kW.…”

Section: Surface Wave Plasmasmentioning

confidence: 99%

Atomic spectroscopy with surface wave plasmas

Hubert

Bordeleau

Tran

et al. 1996

Analytical and Bioanalytical Chemistry

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The use of microwave induced plasmas, particularly of surface wave plasmas, as detectors in atomic emission spectrometry for elemental analysis is reviewed. Surface wave plasmas have been produced at low HF power and used as gas chromatographic detectors. The analytical performances for the detection of non-metals with a Fourier transform spectrometer and a two-channel filter unit are reported. The excitation behavior of non-metals in helium-based mixed gas-plasmas has also be studied. In particular, the effect of power and of nitrogen concentration on the bromine emission has been systematically investigated. A nine-fold improvement of the detection limits for bromine can be obtained in a high power (900 W) helium-nitrogen (0.1-0.2%) plasma.

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Microwave‐Induced Plasma Systems in Atomic Spectroscopy

Broekaert

Engel

2000

Encyclopedia of Analytical Chemistry

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The use of microwave plasmas as radiation sources for optical atomic emission (AES), absorption (AAS) and fluorescence (AFS) spectroscopy and for laser ionization spectroscopy is treated and reference is also made to the use of microwave‐induced plasmas (MIPs) as ion sources for mass spectrometry (MS). Devices for producing both single‐electrode and electrodeless microwave plasmas are treated, in addition to methods for their diagnostics, and results for the analytically relevant plasma parameters are presented. Methods for sample introduction are discussed. They include dry aerosol generation techniques (hydride generation (HG), electrothermal evaporation, spark and laser ablation (LA)) and possibilities for the uptake of wet aerosols. Special reference is made to coupling with gas chromatography (GC) and also to the potential for coupling with high‐performance liquid chromatography (HPLC) Further, the use of microwave plasmas for cross‐excitation in the case of glow discharges (GDs) is treated. The analytical figures of merit in the case of AES with low‐power microwave plasmas, single‐electrode microwave plasmas, plasma torch sources and stabilized capacitively coupled plasmas are given also in the case of atomic absorption, fluorescence and laser ionization with these sources. The developments in MS in the case of both low‐power and high‐power microwave plasmas and in the case of various types of sample introduction are discussed. Applications of MIP atomic spectroscopy are in the fields of biological samples with special reference to microanalysis, and of environmental samples with special emphasis on metal speciation, on‐line monitoring and direct solids analysis. A critical comparison of the methodology with other methods for the determination of the elements and their species is given.

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Atmospheric-Pressure Argon Surface-Wave Plasma (SWP) as an Ion Source in Elemental Mass Spectrometry

Cited by 14 publications

References 22 publications

Characterisation of a Microwave-induced Plasma Atomic Emission Spectrometry System Using a Modified Plasma Torch Coupled With Pneumatic and Hydraulic High-pressure Nebulization

Characterisation of a Microwave-induced Plasma Atomic Emission Spectrometry System Using a Modified Plasma Torch Coupled With Pneumatic and Hydraulic High-pressure Nebulization

Atomic spectroscopy with surface wave plasmas

Microwave‐Induced Plasma Systems in Atomic Spectroscopy

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