Atom probe tomography today

Cerezo, A.; Clifton, P. H.; Galtrey, M. J.; Humphreys, C. J.; Kelly, Tom; Larson, David J.; Lozano-Pérez, Sergio; Marquis, Emmanuelle A.; Oliver, Rachel A.; Sha, Gang; Thompson, Keith; Zandbergen, M.W.; Alvis, Roger

doi:10.1016/s1369-7021(07)70306-1

Cited by 114 publications

(82 citation statements)

References 49 publications

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“…In the last decade, the method was revolutionized by introducing fast delayline detector systems [17][18][19] and sample preparation based on focused ion beams (FIB) [20,21]. Nowadays, a reconstructed volume of typically 10 6 nm 3 , comprising about 100 million atoms, can be regularly expected from a successful measurement.…”

Section: Atom Probe Tomographymentioning

confidence: 99%

Nanoanalysis and Ion Conductivity of Thin Film Battery Materials

Schmitz¹,

Abouzari²,

Berkemeier³

et al. 2010

Zeitschrift Für Physikalische Chemie

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Thin Films / Battery Electrodes / Microscopical Analysis / Glass Membranes / Ionic ConductivityThin film ion-conductive materials may represent essential components of future all-solidstate batteries. Besides, they are also of interest from a fundamental point of view. In this article, the deposition of thin films of complex oxides and amorphous glasses is discussed. Methods of local chemical analysis by analytical electron microscopy and atom probe tomography are described and studies of atomic transport in sputtered network glasses are presented. As experimental examples, thin films of Li borate and silicate glasses, LiCoO 2 , V 2 O 5 , and Li 4 Ti 5 O 12 are addressed.

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Section: Atom Probe Tomographymentioning

confidence: 99%

Nanoanalysis and Ion Conductivity of Thin Film Battery Materials

Schmitz¹,

Abouzari²,

Berkemeier³

et al. 2010

Zeitschrift Für Physikalische Chemie

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“…Current wide angle instruments with high frequency HV-or laser-pulsers are capable of analyzing a volume of 100 Â 100 Â 1000 nm 3 within a timescale of a few hours or days at maximum. 8,9 Accordingly, a statistically significant number of interfaces can be studied by an adequately fast method. Accurate analysis of multilayer interfaces with APT is nowadays well established 5 even with isotope multilayers.…”

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confidence: 99%

Interface sharpening in miscible Ni/Cu multilayers studied by atom probe tomography

Balogh

Chellali

Greiwe

et al. 2011

Applied Physics Letters

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Interfaces of Ni/Cu multilayers were studied by atom probe tomography. To this aim, specimens with sharp or artificially smeared interfaces were prepared and investigated before and after annealing at 773 K. Owing to three-dimensional subnanometer resolution of the atom probe, local chemical analysis of layer interfaces becomes possible without interferences of grain boundaries or geometric roughness. In contrast to the classical expectation for a miscible system, but in agreement with more recent theoretical considerations, diffusion reduces the chemical width of the interfaces by up to 50%.

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“…Recently, Schiffbauer and Xiao (2009) Atom probe tomography (APT) delivers the highest spatial resolution (<0.3 nm) for 3D compositional information of any microscopy technique, thus enabling analytics at the atomic scale (Kelly and Miller 2007). The technique combines a time-of-flight mass spectrometer with a fieldion microscope capable of atomic scale imaging (Cerezo et al 2007). The combination with position sensing allows for a full 3D reconstruction by APT.…”

Section: Discussionmentioning

confidence: 99%