2006
DOI: 10.1016/j.susc.2006.07.022
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Atomic assembly of metal surfaces and interfaces

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Cited by 18 publications
(18 citation statements)
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References 34 publications
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“…The predicted misfit dislocation structures are also similar to those observed by high-resolution transmission electron microscopy [31,32]. Recent simulations of ion interactions with a model Co-on-Cu bilayer system indicate that low (5-10 eV) energy impacts can be highly effective at flattening small (10 atoms) cobalt clusters on (1 1 1) copper surfaces without inducing interfacial alloying [24,33,34]. They also reveal that appropriate combinations of ion species (mass), ion energy, ion fluence, and ion incident angle can be used to selectively activate either atom recoil, atomic exchange, or direct jumping mechanisms to flatten surface asperities [24,33].…”
Section: Introductionsupporting
confidence: 64%
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“…The predicted misfit dislocation structures are also similar to those observed by high-resolution transmission electron microscopy [31,32]. Recent simulations of ion interactions with a model Co-on-Cu bilayer system indicate that low (5-10 eV) energy impacts can be highly effective at flattening small (10 atoms) cobalt clusters on (1 1 1) copper surfaces without inducing interfacial alloying [24,33,34]. They also reveal that appropriate combinations of ion species (mass), ion energy, ion fluence, and ion incident angle can be used to selectively activate either atom recoil, atomic exchange, or direct jumping mechanisms to flatten surface asperities [24,33].…”
Section: Introductionsupporting
confidence: 64%
“…Nonetheless, the simulated conditions were carefully chosen to ensure that the time interval between ion or adatom arrival was at least 0.15 ps or above. This time interval allows the impact-induced surface reconstructions to be realistically captured and should allow the effects of assisting ions to be accurately predicted [24,33]. The study was restricted to argon ion effects since it is the most commonly used inert gas in ion-assisted vapor deposition experiments.…”
Section: Molecular Dynamics Simulationmentioning
confidence: 99%
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“…Low energy IBD would improve the uniformity of the film thickness and reduce interlayer mixing but requires a large target to avoid overspill sputtering. Previous simulation studies [40][41][42] Instead of using a conventional grid ion beam source, the BTIBD applies two novel low energy ion sources that combine an end-Hall ion source [44] and a hollow cathode electron source [45]. The advantage of this combined source over conventional IBD source is that it can provide a very high density of inert gas ions with very low energy (several eV) [39].…”
Section: Biased Target Ion Beam Deposition (Btibd)mentioning
confidence: 99%