2006
DOI: 10.1007/3-540-27453-7_2
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Atomic Force Acoustic Microscopy

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Cited by 119 publications
(164 citation statements)
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“…Because of the detection of the acoustic amplitude signal which allows us to distinguish different levels of softness of surface layers, it is possible to evaluate the layer quality. 59 The printed stripes on a Si wafer 100 with native oxide ( Figure 3A) show a homogeneous layer and monolayer quality except for the edges of the stamp stripes were silane solution can concentrate during printing because of the applied pressure. Therefore, careful drying of the incubated stamps is necessary for homogeneous monolayers.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Because of the detection of the acoustic amplitude signal which allows us to distinguish different levels of softness of surface layers, it is possible to evaluate the layer quality. 59 The printed stripes on a Si wafer 100 with native oxide ( Figure 3A) show a homogeneous layer and monolayer quality except for the edges of the stamp stripes were silane solution can concentrate during printing because of the applied pressure. Therefore, careful drying of the incubated stamps is necessary for homogeneous monolayers.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…A variety of different modeling approaches have been used for this purpose and have been applied with a great deal of success to both hard materials and to soft materials that exhibit viscoelastic behavior. 23,29 In this work, we confine ourselves to demonstrating the utility of electrostatic actuation for measuring contact resonance frequencies, without emphasizing any particular modeling approach for extracting quantitative mechanical property information from the contact resonance observables.…”
Section: Contact Resonance Microscopymentioning
confidence: 99%
“…This technique is based on transmission and reflection of ultrasonic waves [Rabe, 2006]. The acoustic microscope is a confocal system, this is that focus occurs when both acoustic waves travel through the specimen and are detected by the lenses.…”
Section: Atomic Force Acoustic Microscopy (Afam)mentioning
confidence: 99%
“…Depending on the local contact stiffness the resonance frequency will change and consequently the vibration amplitude of the work frequency will change, which will also be reflected in contrast differences in amplitude images. These images provide qualitative information about differences in stiffness in regions of the sample surface [KopycinskaMüller, et al, 2007;Rabe, 2006].…”
Section: Atomic Force Acoustic Microscopy (Afam)mentioning
confidence: 99%
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