Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential

Lyuksyutov, Sergei F.; Paramonov, Pavel; Mayevska, Olga; Reagan, Michael A.; Sancaktar, Erol; Vaia, Richard A.; Juhl, Shane

doi:10.1016/j.ultramic.2006.04.002

Cited by 4 publications

(5 citation statements)

References 10 publications

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“…In addition to previously proposed mechanism for tip repulsion, 20,21 we demonstrate that the meniscus impact force is another possible source for the enlargement of the tip-surface junction. We show that in fieldinduced meniscus formation, the meniscus can generate a hydrodynamic impact force large enough to overcome the electrostatic force acting on the tip.…”

supporting

confidence: 68%

“…Several analytical models 12 such as sphere, single charge, and perfect cone models 13 have been proposed to quantify the force. 20 In their model, the tip and polymer substrate form a capacitor, and the observed tip deflection is due to the changing of the capacitor. Upon field application, the tip will be attracted to the surface by the electrostatic force, making the tip-surface distance smaller than the initial one without tip bias application.…”

mentioning

confidence: 99%

“…In general, the electrostatic force is dependent on the tip voltage, tip-surface spacing, and the shape of the tip. 20 As for AFM nano-oxidation, Tello and Garcia proposed that the growing oxide could push back the cantilever in the course of oxide formation. In AFM nanolithography, the height of nanostructures is limited by the tip-surface distance, which is typically less than 10 nm for contact mode AFM operations.…”

mentioning

confidence: 99%

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Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interface

Xie

Chung

Tong

et al. 2007

Journal of Applied Physics

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We describe the spatiotemporal evolution of the nanoscale tip-surface junction during field-induced water meniscus formation in the junction. The motion of the meniscus and tip was analyzed on the basis of typical parameters concerning the nanoscale meniscus and tip-surface configuration. Being attracted by the electric field, the meniscus generates a repulsive hydrodynamic impact force counteracting the electrostatic force on the tip. The imbalance of the forces leads to an increase of the tip-surface separation distance, and the increase is related to the initial experimental parameters including tip bias voltage and tip spring constant. An explicit equation was derived for the estimation of the tip-surface junction enlargement effect. The theoretical results were confirmed by atomic force microscope (AFM) in situ observations of tip repulsion under electric fields. The induced tip-surface junction enlargement has significant implications in AFM nanolithography, e.g., it could facilitate the formation of nanostructures with high vertical dimensions/aspect ratios.

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supporting

confidence: 68%

mentioning

confidence: 99%

mentioning

confidence: 99%

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Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interface

Xie

Chung

Tong

et al. 2007

Journal of Applied Physics

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“…and that the properties of menisci depend on the field-induced polarization of the water layer adsorbed on the surface, the surface energy, and ambient water condensation from humid air 26 . A modeling of induced water condensation 27 , and free energy analysis of the system comprising of the tip, a water bridge, and a polymeric surface suggests water polarization due to the external electric field plays an essential role and affects tip dynamics 28 . Furthermore, it has been shown that the formation of a water meniscus in the proximity of an AFM tip is a major factor in electric charge transport 29 and generation of charge carriers 30 at the tip-surface junction.…”

Section: Stage I: Rearrangements In An Alkylthiolate Self-assembled Mmentioning

confidence: 99%

Electric charging and nanostructure formation in polymeric films using combined amplitude-modulated atomic force microscopy-assisted electrostatic nanolithography and electric force microscopy

Reagan

Kashyn

Juhl

et al. 2008

Applied Physics Letters

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Chemically induced rearrangements of amphifunctional molecules have been demonstrated using strong nonuniform electric fields (10 8-10 10 V/m) induced in the vicinity of nanoscale asperities. Electrostatic interactions utilizing these rearrangements of alkylthiolates assembled on Au(111) result in the nanopatterning of raised nanostructure (1.5-9 nm high, 15-100 nm wide) arrays on a second time scale by manipulating an atomic force microscope (AFM) tip above the monolayer. It is suspected that, as a result of the oxidative cleavage initiated by a weak bias of the tip, the S end of the alkylthiolate chain carrying a sulfenium cation is attracted to the (lifting) tip, forming bi-and higher-layer structures in the vicinity of the tip apex. Stabilization of the multiplelayered structures is accomplished via mutual attraction and entanglement of hydrocarbon chains. The rearrangements suggest a novel and general approach for nanoscale architecture in self-assembled systems. Water condensation is shown to have a major influence on electric charge transport and nanostructure formation in polymer-, and semiconductor-thin-film surfaces in the proximity of a biased Atomic Force Microscope (AFM) tip. The water forms a meniscus bridge between the AFM tip and the surface to form a three-component system comprised of the AFM tip, water meniscus, and the surface. The associated electric field in the meniscus is spatially non-uniform and has a magnitude of the order of 10 8-10 10

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“…It has also been shown that nanometer-size menisci of organic liquids may sustain chemical reactions [7], and that the properties of menisci depend on the field-induced polarization of the water layer adsorbed on the surface, the surface energy, and ambient water condensation from humid air [8]. A modeling of induced water condensation [9], and free energy analysis of the system comprising of the tip, a water bridge, and a dielectric surface suggests water polarization due to the external electric field plays an essential and affects tip dynamics [10]. Furthermore, it has been shown that the formation of a water meniscus in the proximity of an AFM tip is a major factor in electric charge transport [11] and generation of charge carriers [12] at the tip-surface junction.…”

Section: Introductionmentioning

confidence: 99%

Influence of Water Condensation on Charge Transport and Electric Breakdown Between an Atomic Force Microscope Tip, Polymeric, and (Semiconductor) CdS Surfaces

Rowicka¹,

Kashyn²,

Reagan³

et al. 2008

CNANO

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Water condensation is shown to have a major influence on electric charge transport and nanostructure formation in polymer-, and semiconductor-thin-film surfaces in the proximity of a biased Atomic Force Microscope (AFM) tip. The water forms a meniscus bridge between the AFM tip and the surface to form a three-component system comprised of the AFM tip, water meniscus, and the surface. The associated electric field in the meniscus is spatially non-uniform and has a magnitude of the order of 10 8 -10 10 Vm -1 . An intensive experimental analysis of the input and output electric currents in the AFM tip/water meniscus/surface system, performed at various relative humidity levels between 10 and 60%, indicates that the magnitude of the output current, drained from surface, reaches values as large as several μA which exceeds the input current, injected via the AFM tip (0.01-10 nA), by at least an order of magnitude. This effect is particularly evident when the relative humidity is greater than 20-25%, suggesting that the water meniscus is ionized by the strong electric field to produce electrons. Since the method described here for nanopatterning is applicable for materials with significantly different physical, electronic, and optical properties, and is dependent largely on the ambient humidity level and the strength of the electric field, it is suggested that the method may be extended to a variety of other materials.

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Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential

Cited by 4 publications

References 10 publications

Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interface

Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interface

Electric charging and nanostructure formation in polymeric films using combined amplitude-modulated atomic force microscopy-assisted electrostatic nanolithography and electric force microscopy

Influence of Water Condensation on Charge Transport and Electric Breakdown Between an Atomic Force Microscope Tip, Polymeric, and (Semiconductor) CdS Surfaces

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