Atomic Force Microscopy: General Principles and a New Implementation

McClelland, Grant B.; Erlandsson, R.; Chiang, S.

doi:10.1007/978-1-4613-1893-4_148

Cited by 82 publications

(24 citation statements)

References 18 publications

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“…This instability occurs in the quasistatic mode if (Tabor and Winterton, 1969;McClelland et al, 1987;Burnham and Colton, 1989). The jump-to-contact can be avoided even for soft cantilevers by oscillating the cantilever at a large enough amplitude A: (Giessibl, 1997).…”

Section: A Stabilitymentioning

confidence: 99%

“…What is the accuracy of the measurement of the oscillation frequency of the cantilever? Martin et al (1987) and McClelland et al (1987) have studied the influence of thermal noise on the cantilever, and Albrecht et al (1991) and Smith (1995) have calculated the thermal limit of the frequency noise. Leaving aside prefactors of the order of , all these authors come to a similar conclusion, namely, that the square of the relative frequency noise is given by the ratio between the thermal energy of the cantilever (k B T) and the mechanical energy stored in it (0.5kA 2 ), divided by its quality factor Q and multiplied by the ratio between bandwidth B and cantilever eigenfrequency f 0 .…”

Section: B Noise In the Frequency Measurementmentioning

confidence: 99%

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Advances in atomic force microscopy

2003

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This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms. CONTENTS

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Section: A Stabilitymentioning

confidence: 99%

Section: B Noise In the Frequency Measurementmentioning

confidence: 99%

Advances in atomic force microscopy

2003

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“…k is the wavenumber related to ω by the dispersion relation (2). φ(k) and φ(k) Lat are functions containing the vertical and lateral contact stiffness and the vertical and lateral interaction damping, respectively: N(k) = k 4 1 + cos(kL) cosh(kL) (A.7c) + k 3 T(k) sin(kL) cosh(kL) + sinh(kL) cos(kL) + 2k 2 X(k) sin(kL) sinh(kL) + kU(k) sin(kL) cosh(kL) − sinh(kL) cosh(kL) + T(k)U(k) − X 2 (k))(1 − cos(kL) cosh(kL) S282 y(L) and α(L) are complex amplitudes due to the complex representation of damping.…”

Section: Discussionmentioning

confidence: 99%

“…The earliest publications on atomic force microscopy (AFM) suggested dynamic modes in which the small microfabricated cantilever vibrates at higher frequencies compared with the tip-sample scanning frequency [1,2]. Originally these methods were used to increase the force sensitivity in non-contact AFM, as, for example, in magnetic force microscopy [3].…”

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confidence: 99%

Analysis of the high-frequency response of atomic force microscope cantilevers

Rabe

Turner

Arnold

1998

Applied Physics A: Materials Science & Processing

152

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In most commercial atomic force microscopes, dynamic modes are now available as standard operation modes. Acoustical vibrations of atomic force microscope cantilevers can be excited either by insonification of the sample or by vibration of the clamped cantilever end. The resulting dynamical system is complex and highly nonlinear. Simplification of this problem is often realized by modeling the cantilever as a one-degree-of-freedom system such that the higher-order flexural modes are neglected. This point-mass model has been successful in advancing material property measurement techniques. The limits and validity of such an approximation have not been fully addressed. In this paper, the flexural beam equation is examined and compared with the point-mass model by using analytical and finite difference numerical techniques. The two systems are shown to have differences in drive-point impedance and are influenced differently by the surface damping and the contact stiffness. The angular deflection at the end of the beam and the influence of lateral sensor tip motion are considered. It is shown that the higher modes must be included for excitations above the first resonance if both the low-and the high-frequency dynamics are to be modeled accurately.The earliest publications on atomic force microscopy (AFM) suggested dynamic modes in which the small microfabricated cantilever vibrates at higher frequencies compared with the tip-sample scanning frequency [1, 2]. Originally these methods were used to increase the force sensitivity in non-contact AFM, as, for example, in magnetic force microscopy [3]. Within the last years, dynamic modes became more widespread and are now available as standard operation modes in most commercial instruments. New dynamic modes (for example the intermittent contact or tapping mode [4] and the force modulation mode [5], where the vibrating cantilever is in repulsive contact with a sample surface) have been * Present address: Department of Engineering Mechanics, 212 Bancroft Hall, University of Nebraska-Lincoln, Lincoln, NE 68588-0347, USA added. In many applications (for example topography imaging of soft surfaces which might be deformed by the forces applied by the sensor tip), dynamic modes have even replaced the contact force and friction mode. But dynamic modes are not only interesting because they supply topography information with less surface damage than the contact mode. They can also provide additional image contrast on sample surface properties, for example stiffness or adhesion. This has been demonstrated for example by the various atomic force acoustic modes [6][7][8]. The range of mechanical vibration frequencies which are used for AFM imaging covers acoustic vibrations (up to 20 kHz) and ultrasonic frequencies from 20 kHz up to the MHz range.

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“…The imaging performance of the shear force SNOM is mainly determined by the response sensitivity of the sensor to the tip–sample interaction forces. It has been shown that the minimum detectable force (or force gradient) by dynamic detection has an inverse dependence on the square root of the sensor quality factor Q (Martin et al ., 1987; McClelland et al ., 1987). When imaging is performed on biological samples in a liquid environment by a shear force sensor, the higher viscosity of the medium increases the interaction force between the tip and the sample and may even damage the sample when using soft materials.…”

Section: Introductionmentioning

confidence: 99%

Shear force near‐field optical microscope based on Q‐controlled bimorph sensor for biological imaging in liquid

Lei

Angiboust

Qiao

et al. 2004

Journal of Microscopy

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Key words. Biological imaging in liquid, Q -enhancement, scanning near-field optical microscopy (SNOM), sensitivity improvement, shear force detection. SummaryShear force near-field microscopy on biological samples in their physiological environment loses considerable sensitivity and resolution as a result of liquid viscous damping. Using a bimorph-based cantilever sensor incorporating force feedback, as recently developed by us, gives an alternative force detection scheme for biological imaging in liquid. The dynamics and sensitivity of this sensor were theoretically and experimentally discussed. Driving the bimorph cantilever close to its resonance frequency with appropriate force feedback allows us to obtain a quality factor ( Q -factor) of up to 10 3 in water, without changing its intrinsic resonance frequency and spring constant. Thus, the force detection sensitivity is improved. Shear force imaging on mouse brain sections and human skin tissues in liquid with an enhanced Q -factor of 410 have shown a high sensitivity and stability. A resolution of about 50 nm has been obtained. The experimental results suggest that the system is reliable and particularly suitable for biological cell imaging in a liquid environment.

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Atomic Force Microscopy: General Principles and a New Implementation

Cited by 82 publications

References 18 publications

Advances in atomic force microscopy

Advances in atomic force microscopy

Analysis of the high-frequency response of atomic force microscope cantilevers

Shear force near‐field optical microscope based on Q‐controlled bimorph sensor for biological imaging in liquid

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