Atomic-force microscopy of gel-drawn ultrahigh-molecular-weight polyethylene

Magonov, S. N.; Sheiko, S.; Deblieck, R.; Möller, Martin

doi:10.1021/ma00058a029

Cited by 58 publications

(40 citation statements)

References 7 publications

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“…Comparison of the height, phase, and amplitude images of B, B s , and B f also show that amplitude imaging mode in AFM displays the morphological details with a better contrast, as pointed out by Magonov et al [1]. The phase image of B f shows the distribution of the FVP particles on the blend surface.…”

Section: Resultssupporting

confidence: 63%

Atomic Force Microscopic Studies on the Silicone Rubber-Fluororubber Blend Containing Ground Rubber Vulcanizate Powder

Ghosh

Ramanan

et al. 2006

Journal of Elastomers & Plastics

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Atomic force microscopic (AFM) studies on the 50/50 blend of silicone rubber and fluororubber based on tetrafluoroethylene-propylenevinylidene fluoride terpolymer reveal that the morphological features do not undergo appreciable change on 50% replacement of the fluororubber in the blend by its vulcanizate powder of fine particle size (%1 mm). On the other hand, 50% replacement of the silicone rubber in the blend by its vulcanizate powder of coarse particle size (%33 mm) causes substantial changes in the morphology. Surface roughness, for example, follows the order, neat blend ! blend with its fluororubber component replaced by its powder > blend with its silicone rubber component replaced by its powder. Mechanical properties follow the same order.

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Section: Resultssupporting

confidence: 63%

Atomic Force Microscopic Studies on the Silicone Rubber-Fluororubber Blend Containing Ground Rubber Vulcanizate Powder

Ghosh

Ramanan

et al. 2006

Journal of Elastomers & Plastics

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“…1, previous research has described a multiscale fibrillar hierarchy composing a single UHMWPE fiber grown or manufactured by various procedures [1,14,15]. At the smallest scale there are fibrillar crystals present in solution grown and gel spun fibers.…”

Section: Introductionmentioning

confidence: 99%

Structural hierarchy and surface morphology of highly drawn ultra high molecular weight polyethylene fibers studied by atomic force microscopy and wide angle X-ray diffraction

McDaniel

Deitzel

Gillespie

2015

Polymer

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“…56 Oriented tapes of ultrahigh-molecular weight polyethylene (UHMWPE) with different draw ratios have been extensively studied with AFM in the contact and tapping modes. 57 The fibrillar morphology of these tapes has been characterized by bundles of microfibrils with diameters in the 4 -7-micron range, by individual microfibrils with diameters between 0.2 and 2 µm and nanofibrils with diameters in the 5 -10-nm range. All these fibrils are oriented along the stretching direction and they are present in the sample bulk.…”

Section: Nanostructure Of Oriented Samplesmentioning

confidence: 99%

Atomic Force Microscopy in Analysis of Polymers

Magonov

2000

Encyclopedia of Analytical Chemistry

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Atomic force microscopy (AFM), in which a sharp probe is employed for profiling surfaces with unique resolution, has developed into an invaluable multidisciplinary technique for advanced characterization of polymer materials. In its basic function, AFM provides high‐resolution imaging of surface structures between the scales of a few nanometers to hundreds of micrometers. This capability is useful for quantitative analysis of surface microroughness of technological surfaces with high sensitivity and accuracy. The direct visualization of polymer structures, from single macromolecules to granular and lamellar nanostructures, to microphase separation and other morphologic patterns, makes AFM an important complementary tool for many of the techniques (light scattering, chromatography, optical and electron microscopy, X‐ray diffraction analysis, etc.) employed in polymer analysis. The advances in AFM of polymers are related to a better understanding of tip–sample force interactions and their use for examination of local sample properties. Different responses of the probing tip to surface locations with different mechanical and adhesive properties are the key for compositional imaging of heterogeneous polymer systems. Compositional mapping with AFM, which does not require any special sample treatment, substantially enhances its microscopic value. Visualization of individual components in block copolymers, polymer blends and semicrystalline materials can be performed with nanometer resolution. In addition to lateral compositional imaging, AFM probing of subsurface structures can be achieved for polymer samples with rubber‐like top layers. A further expansion of AFM applications is expected with the imaging of polymers at different temperatures. Monitoring of polymer structural changes at thermal phase transitions could help in the understanding of polymer melting, crystallization, recrystallization, glass transition and physical aging. In such applications, AFM will complement various thermal techniques. The review describes the basics of AFM, practical aspects of its applications to polymers and presents a broad range of examples illustrating the main trends in AFM of polymer materials.

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Atomic-force microscopy of gel-drawn ultrahigh-molecular-weight polyethylene

Cited by 58 publications

References 7 publications

Atomic Force Microscopic Studies on the Silicone Rubber-Fluororubber Blend Containing Ground Rubber Vulcanizate Powder

Atomic Force Microscopic Studies on the Silicone Rubber-Fluororubber Blend Containing Ground Rubber Vulcanizate Powder

Structural hierarchy and surface morphology of highly drawn ultra high molecular weight polyethylene fibers studied by atomic force microscopy and wide angle X-ray diffraction

Atomic Force Microscopy in Analysis of Polymers

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