Atomic Layer Deposition in Energy Conversion Applications 2017
DOI: 10.1002/9783527694822.ch2
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Atomic Layer Deposition for High‐Efficiency Crystalline Silicon Solar Cells

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Cited by 16 publications
(12 citation statements)
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“…For this application to be successful, a sufficiently low contact resistivity of passivating ZnO with c-Si will be a prerequisite. 47,48 Finally, it is expected that the approach and insights presented in this work will be more generally applicable and can aid the development of other (emerging) surface passivation and passivating contact materials.…”
Section: Discussionmentioning
confidence: 92%
“…For this application to be successful, a sufficiently low contact resistivity of passivating ZnO with c-Si will be a prerequisite. 47,48 Finally, it is expected that the approach and insights presented in this work will be more generally applicable and can aid the development of other (emerging) surface passivation and passivating contact materials.…”
Section: Discussionmentioning
confidence: 92%
“…Doping was introduced in a supercycle fashion, in which an integer n ZnO ALD cycles was alternated by one DMAI cycle [53]. The cycle ratio n was used to accurately control the Al doping level [3,54]. Note that our supercycle recipes were designed such that one supercycle consists of n/2 ZnO cycles, one Al dopant cycle, followed by n/2 ZnO cycles.…”
Section: Methodsmentioning
confidence: 99%
“…the contact resistivity ρ c should be low. At the same time, recombination of minority carriers should be suppressed, thus enabling a low recombination parameter J 0 [2][3][4][5][6][7]. Together, these two parameters define the charge-carrier selectivity of the contacting scheme.…”
Section: Introductionmentioning
confidence: 99%
“…So far, there have been many reports on how to optimize the deposition of Al 2 O 3 thin films, such as using trimethylaluminum (TMA, Al 2 (CH 3 ) 6 ) and O 3 to deposit Al 2 O 3 thin films [22,23]. Dueñas et al reported the electrical properties of Al 2 O 3 -metal-insulator semiconductor structures prepared by ALD using AlCl 3 and H 2 O [24].…”
Section: Introductionmentioning
confidence: 99%