2014
DOI: 10.1021/cm503587w
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Atomic Layer Deposition of Aluminum Phosphate Based on the Plasma Polymerization of Trimethyl Phosphate

Abstract: Aluminium phosphate thin films were deposited by plasma-assisted atomic layer deposition (ALD) using a sequence of trimethyl phosphate (TMP, Me 3 PO 4 ) plasma, O 2 plasma and trimethylaluminium (TMA, Me 3 Al) exposures. In-situ characterization was performed, including spectroscopic ellipsometry, optical emission spectroscopy, mass spectrometry and FTIR. In the investigated temperature region between 50 • C and 320 • C, nucleation delays were absent and linear growth was observed, with the growth per cycle (G… Show more

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Cited by 40 publications
(78 citation statements)
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“…As mentioned in the Introduction, when using TMP plasma, a sufficiently high substrate temperature is required in order to inhibit the spontaneous plasma polymerization of TMP, which would result in PE-CVD instead of PE-ALD. Our previous studies using TMP plasma have established this temperature to be 300 C. 12,13,17,18 At this temperature, however, some metalorganic precursors will thermally decompose; this is also the case for our vanadium precursor candidates. From literature, the decomposition temperatures of VTIP and TEMAV are 200 and 175 C, respectively, so one would expect strong thermal decomposition of both precursors at 300 C. [23][24][25] To test their decomposition behavior, we ran experiments where we pulsed the precursors into the chamber onto a silicon substrate heated to 300 C, while using in situ ellipsometry to monitor film growth.…”
Section: A Decomposition Experimentsmentioning
confidence: 89%
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“…As mentioned in the Introduction, when using TMP plasma, a sufficiently high substrate temperature is required in order to inhibit the spontaneous plasma polymerization of TMP, which would result in PE-CVD instead of PE-ALD. Our previous studies using TMP plasma have established this temperature to be 300 C. 12,13,17,18 At this temperature, however, some metalorganic precursors will thermally decompose; this is also the case for our vanadium precursor candidates. From literature, the decomposition temperatures of VTIP and TEMAV are 200 and 175 C, respectively, so one would expect strong thermal decomposition of both precursors at 300 C. [23][24][25] To test their decomposition behavior, we ran experiments where we pulsed the precursors into the chamber onto a silicon substrate heated to 300 C, while using in situ ellipsometry to monitor film growth.…”
Section: A Decomposition Experimentsmentioning
confidence: 89%
“…1 This comes at the expense of very slow growth (typically in the order of 1 Å /cycle), making ALD most suitable for very thin films. Although many different ALD processes have been developed for various classes of materials such as oxides, ii-vi and iii-v semiconductors, metal nitrides, metals, metal sulfides, and fluorides, 2 the existing reports on ALD of phosphates are still limited, [3][4][5][6][7][8][9][10][11][12][13] but have recently been increasing in number because of their relevance as electrode [14][15][16][17][18] or electrolyte [19][20][21][22] films in lithium-ion batteries.…”
Section: Introductionmentioning
confidence: 99%
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“…[21][22][23] Some of the authors have developed a plasma-enhanced (PE-ALD) method which has the advantage of having much higher growth per cycle (GPC) values than other processes, speeding up deposition times for thicker lms. 22,24 In this work, ALD was used to deposit cobalt and iron phosphate lms with electrocatalytic activity for both HER and OER. In addition, post-deposition thermal reduction was used to obtain phosphide electrocatalysts for HER.…”
Section: Introductionmentioning
confidence: 99%