2008
DOI: 10.1021/cm7030224
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Atomic Layer Deposition of Iridium Oxide Thin Films from Ir(acac)3 and Ozone

Abstract: Iridium oxide thin films were grown with atomic layer deposition (ALD) from Ir(acac) 3 and ozone between 165 and 200 °C. The films were successfully deposited on soda lime glass, silicon substrate with native oxide, and Al 2 O 3 adhesion layer. Saturation of the growth rate with respect to both precursors was verified and the film thickness depended linearly on the number of deposition cycles applied. The iridium oxide films had low impurity contents and good adhesion to all tested surfaces. IrO 2 film deposit… Show more

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Cited by 69 publications
(53 citation statements)
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“…20 For the process employing Pt͑acac͒ 2 and O 3 , only a small temperature window was observed ͑120-130°C͒. 13 Therefore, the large temperature window of our PtO 2 process suggests a higher stability of the material, which can most likely be related to the higher oxygen content ͑PtO 2.2 compared to PtO 1.6 ͒.…”
Section: Resultsmentioning
confidence: 88%
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“…20 For the process employing Pt͑acac͒ 2 and O 3 , only a small temperature window was observed ͑120-130°C͒. 13 Therefore, the large temperature window of our PtO 2 process suggests a higher stability of the material, which can most likely be related to the higher oxygen content ͑PtO 2.2 compared to PtO 1.6 ͒.…”
Section: Resultsmentioning
confidence: 88%
“…For the process employing Pt͑acac͒ 2 and O 3 , a lower resistivity ͑1.5-5 ⍀ cm͒ was reported most probably due to a lower O content ͑PtO 1.6 ͒. 13,20 The Table I. The starting substrate at 0 cycles was Si͑100͒ with 400 nm SiO 2 .…”
Section: Resultsmentioning
confidence: 99%
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