2016
DOI: 10.1021/acs.jpcc.6b01803
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Atomic Layer Deposition of Silicon Dioxide Using Aminosilanes Di-sec-butylaminosilane and Bis(tert-butylamino)silane with Ozone

Abstract: In situ Fourier transform infrared (FTIR) spectroscopy is used to investigate silicon dioxide deposition on OH-terminated oxidized Si(100) surfaces using two aminosilanes, di-sec-butylaminosilane (DSBAS) and bis­(tert-butylamino)­silane (BTBAS), with ozone as the coreactant. Both DSBAS and BTBAS readily react at 100 °C with surface −OH groups (loss at 3745 cm–1) with formation of Si–O–SiH3 and Si–O–SiH2–(NH t Bu), respectively, through elimination of secondary and primary amines. The (O−)­SiH3 structure is cha… Show more

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Cited by 36 publications
(22 citation statements)
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“…The FT‐IRRAS method provides the most detailed structural characterization of planar nanoscale oxide layers and interfaces because of its high surface sensitivity due to the electric field enhancement of perpendicularly polarized infrared modes, the ability to monitor signals from amorphous and crystalline phases alike, and to probe interfacial chemical bonds. The p‐polarized FT‐IRRAS of 2 nm SiO 2 samples reveals a characteristic, intense absorption of the longitudinal optic (LO) asymmetric SiOSi stretch mode at 1236 cm −1 with a shoulder at 1150 cm −1 (in‐ and out‐of‐phase motion of two adjacent O atoms with respect to the center Si atom) shown in Figure a. Interestingly, the corresponding transverse optic asymmetric ν(SiOSi) mode of amorphous silica wafers with a sharp peak at 1080 cm −1 is not observed because this mode cannot absorb p‐polarized light .…”
Section: Resultsmentioning
confidence: 98%
“…The FT‐IRRAS method provides the most detailed structural characterization of planar nanoscale oxide layers and interfaces because of its high surface sensitivity due to the electric field enhancement of perpendicularly polarized infrared modes, the ability to monitor signals from amorphous and crystalline phases alike, and to probe interfacial chemical bonds. The p‐polarized FT‐IRRAS of 2 nm SiO 2 samples reveals a characteristic, intense absorption of the longitudinal optic (LO) asymmetric SiOSi stretch mode at 1236 cm −1 with a shoulder at 1150 cm −1 (in‐ and out‐of‐phase motion of two adjacent O atoms with respect to the center Si atom) shown in Figure a. Interestingly, the corresponding transverse optic asymmetric ν(SiOSi) mode of amorphous silica wafers with a sharp peak at 1080 cm −1 is not observed because this mode cannot absorb p‐polarized light .…”
Section: Resultsmentioning
confidence: 98%
“…The formation of SiO-SiH 3 intermediate species had been conrmed by Peña et al using in situ Fourier transform infrared (FTIR) spectroscopy. 48 We rst focus on the reactivity of DIPAS, which has been experimentally examined, to understand the reaction mechanism of a Si precursor on the hydroxylated SiO 2 (001) surface. The optimized structures with the main structural parameters and energy variations for the dissociative reaction of DIPAS are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, Figure b shows a broad signal of the O 1s XPS spectrum for CB, which is deconvoluted into three components that can be ascribed to the contributions from C=O (530.8 eV), C–OH (532.2 eV), and –COOH (533.6 eV) . Meanwhile, the O 1s peak for ZnO/CB hybrids, shown in Figure e, shifts to the lower binding‐energy side, and the peak is resolved into four components.…”
Section: Resultsmentioning
confidence: 97%
“…At last, due to the effect of adsorbed H 2 O on the FTIR spectra, unfortunately, it is difficult to discriminate the broad bands of the O–H stretching mode and other groups that contained C–O bands at 3400 and 3450 cm –1 . [15b]…”
Section: Resultsmentioning
confidence: 99%
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