1995
DOI: 10.1016/0039-6028(95)00471-8
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Atomic layer growth of SiO2 on Si(100) using SiCl4 and H2O in a binary reaction sequence

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Cited by 143 publications
(161 citation statements)
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“…Earlier studies of SiO 2 ALD at higher temperatures of 600 -680 K were consistent with the first mechanism where SiCl 4 reacts with one hydroxyl group [5]. Different mechanisms may be expected for catalyzed SiO 2 ALD at low temperatures and uncatalyzed SiO 2 ALD at much higher temperatures.…”
Section: Sio 2 Ald Film Growthmentioning
confidence: 66%
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“…Earlier studies of SiO 2 ALD at higher temperatures of 600 -680 K were consistent with the first mechanism where SiCl 4 reacts with one hydroxyl group [5]. Different mechanisms may be expected for catalyzed SiO 2 ALD at low temperatures and uncatalyzed SiO 2 ALD at much higher temperatures.…”
Section: Sio 2 Ald Film Growthmentioning
confidence: 66%
“…4 was 30 ng cm À 2 per cycle or 1.35 Å per cycle assuming a SiO 2 density of 2.2 g cm À 3 [5,6]. This maximum SiO 2 growth rate is obtained with !…”
Section: Sio 2 Ald Film Growthmentioning
confidence: 99%
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“…In addition, the decomposition of the Fe(CO) 5 the shape of the Si peak and the appearance of a small peak at 63 eV. Sneh et al reported AES spectra during SiO 2 growth on Si(100), which showed the 63 eV peak of stoichiometric SiO 2 and the O (KLL) feature at 509 eV [27]. The appearance of the 63 eV peak after oxidation of the Fe/SiC surface indicates that some of the surface Si was oxidized.…”
Section: Fe/sic and O/fe/sic Surfacesmentioning
confidence: 95%