2009
DOI: 10.1039/b920784h
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Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

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Cited by 16 publications
(17 citation statements)
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References 431 publications
(325 reference statements)
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“…This Update refers to papers published approximately between April 2009 and March 2010 and continues the series of Atomic Spectroscopy Updates in X-ray Fluorescence Spectrometry 1 that should be read in conjunction with other related reviews in the series. [2][3][4][5][6] As this journal celebrates 25 years in print, it is perhaps interesting to track the developments in XRF instrumentation.…”
Section: Introduction and Reviewsmentioning
confidence: 99%
“…This Update refers to papers published approximately between April 2009 and March 2010 and continues the series of Atomic Spectroscopy Updates in X-ray Fluorescence Spectrometry 1 that should be read in conjunction with other related reviews in the series. [2][3][4][5][6] As this journal celebrates 25 years in print, it is perhaps interesting to track the developments in XRF instrumentation.…”
Section: Introduction and Reviewsmentioning
confidence: 99%
“…The feasibility of determining Li isotope ratios in natural and synthetic glasses by LA-MC-ICP-MS has been demonstrated 328 . Because of the large relative difference in abundance between the two Li isotopes, asymmetric tuning of the quadrupole lenses was required for simultaneous measurement of 7 Li and 6 Li on a Faraday -ion counter configuration. The NIST series of standard glasses proved to be TIMS data within the limits of uncertainty.…”
Section: Patterns Of Fractionation With Crater Depth Can Vary Markedly Betweenmentioning
confidence: 99%
“…spectrometry to the chemical analysis of environmental samples. This Update refers to papers published approximately between September 2009 and August 2010 and continues the series of Atomic Spectrometry Updates in Environmental Analysis 1 that should be read in conjunction with other related reviews in the series [2][3][4][5][6] . In the analysis of air, work is ongoing in developing new and existing air sampler devices with an increasing focus on sampling nanoparticles.…”
mentioning
confidence: 99%
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“…Currently, compositional analysis instruments have been widely adopted to determine the level of contamination and particle composition using an X-ray and inductively coupled plasma techniques [ 14 , 15 , 16 ]. The samples used for analysis must be collected in advance and pre-treated.…”
Section: Introductionmentioning
confidence: 99%