1998
DOI: 10.1103/physrevlett.81.850
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Atomistic Mechanism of Surfactant-Assisted Epitaxial Growth

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Cited by 127 publications
(89 citation statements)
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“…This capping monolayer of surfactant atoms forces a layer-by-layer growth mode even for Cu atoms on top of a Co surface. A combined experimental and simulation study 22 has, furthermore, revealed the atomistic mechanism by which the surfactant induces a layer-by-layer growth. This proceeds via suppressing the hopping mechanism of surface diffusion over the terraces and promoting atomic exchange between surfactant and deposited atoms, both at the terraces and across the steps.…”
Section: D332mentioning
confidence: 99%
“…This capping monolayer of surfactant atoms forces a layer-by-layer growth mode even for Cu atoms on top of a Co surface. A combined experimental and simulation study 22 has, furthermore, revealed the atomistic mechanism by which the surfactant induces a layer-by-layer growth. This proceeds via suppressing the hopping mechanism of surface diffusion over the terraces and promoting atomic exchange between surfactant and deposited atoms, both at the terraces and across the steps.…”
Section: D332mentioning
confidence: 99%
“…When Pb is deposited onto Cu(111) at room temperature (RT), the growth mode is of Stranski-Krastanov type [14], i. e. islands start to grow once a wetting layer is complete. These islands are (111)-oriented nanocrystallites with a height distribution that is not statistical.…”
mentioning
confidence: 99%
“…16 In many cases, exchange processes can lead to surfactant-assisted epitaxial growth, since the floating layer can promote epitaxial growth by modifying the diffusion mechanism of the growing layer. 13,17 The place exchange at the level of the monolayer is driven by the difference in the interaction with the Au(111) substrate; while the adsorption energy of exTTF on Au(111) is only of 0.32 eV per molecule, 8 the expected adsorption energy of PCBM is substantially larger, since for C 60 on Au(111) it is of the order of 1.9 eV per molecule. 18 In order to determine the dependence of the exchange process on the thickness of the exTTF layer, we deposited B0.5 ML of PCBM on top of a B2.5 ML-thick film of exTTF (Fig.…”
mentioning
confidence: 99%