2018
DOI: 10.1109/tns.2017.2772901
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Atypical Effect of Displacement Damage on LM124 Bipolar Integrated Circuits

Abstract: LM124 operational amplifiers from three different manufacturers are irradiated with 60 Co gamma rays and neutrons. During neutrons irradiation, one of the three integrated circuits exhibits an unexpected slew rates increase while its open loop gain and supply bias current follow the usual monotonic decrease as described in the literature. Analysis at circuit level shows that this phenomenon is due to an increase in the radiationinduced base current of the transistor used as buffer stage in the amplification ch… Show more

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Cited by 2 publications
(2 citation statements)
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“…Several studies [15][16][17][18][19][20][21] have been conducted recently on the commercial OPA Integrated Circuits (ICs) under neutron radiation and they found that the characteristics of OPAs such as gain, slew rate, offset current, etc. are degraded after the radiation.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Several studies [15][16][17][18][19][20][21] have been conducted recently on the commercial OPA Integrated Circuits (ICs) under neutron radiation and they found that the characteristics of OPAs such as gain, slew rate, offset current, etc. are degraded after the radiation.…”
Section: Introductionmentioning
confidence: 99%
“…These changes in the gain and slew rate will affect the shape of the output signal; for example, a sinusoidal signal became a sawtooth wave due to these changes. In reference [16], LM124 from three different manufactures was irradiated under 1 MeV neutron radiation at two different fluences of 1 × 10 12 ncm −2 and 5 × 10 12 ncm −2 , respectively. All three ICs showed a decrease in the supply bias current, open-loop gain, and slew rate, except one of the devices which showed an increase in the slew rate after irradiation, due to the increase in the base current of the transistor used in the buffer stage.…”
Section: Introductionmentioning
confidence: 99%