2004
DOI: 10.1016/j.tsf.2004.02.085
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Auto-correlation function analysis of phase formation in iron ion-implanted amorphous silicon layers

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Cited by 5 publications
(2 citation statements)
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“…Ion-beam synthesis is used in particular to produce a thin film of iron silicide on the silicon surface [7,8]. Several types of silicides (FeSi 2 , FeSi, and Fe 3 Si) are concurrently formed during the Fe-ion implantation into silicon matrix [9]. Therefore, it is difficult to obtain materials with a preferred phase.…”
Section: Introductionmentioning
confidence: 99%
“…Ion-beam synthesis is used in particular to produce a thin film of iron silicide on the silicon surface [7,8]. Several types of silicides (FeSi 2 , FeSi, and Fe 3 Si) are concurrently formed during the Fe-ion implantation into silicon matrix [9]. Therefore, it is difficult to obtain materials with a preferred phase.…”
Section: Introductionmentioning
confidence: 99%
“…Mainly, three stable silicides (FeSi 2 , FeSi, and Fe 3 Si) are possible in this process. [19][20][21] Since the properties of iron silicide are strongly dependent on the phase, chemical state analysis of iron silicide is important. X-ray photoelectron spectroscopy (XPS) can be used to analyze the chemical state.…”
Section: Introductionmentioning
confidence: 99%