Automated calculations for computing the sample-limited spatial resolution in (scanning) transmission electron microscopy

Zulfiqar, Abid; Azim, Sana; Ortega, Eduardo; Jonge, Niels de

doi:10.1016/j.ultramic.2022.113611

Ultramicroscopy

2022

DOI: 10.1016/j.ultramic.2022.113611

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Automated calculations for computing the sample-limited spatial resolution in (scanning) transmission electron microscopy

Abid Zulfiqar

Sana Azim²,

Eduardo Ortega³

et al.

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2024

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Cited by 3 publications

References 23 publications

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In Situ TEM Imaging Reveals the Dynamic Interplay Between Attraction, Repulsion and Sequential Attraction‐Repulsion in Gold Nanoparticles

Zulfiqar,

Honkanen,

Nonappa

et al. 2024

Small

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Recent efforts on manipulating metal nanoparticles (NPs) using an electron beam have offered new insights into nanoparticle behavior, structural transition, and the emergence of new properties. Despite an increasing understanding of the dynamics of electron beam‐induced coalescence of NPs, several phenomena are yet to be investigated. Here, we show that repulsion between two NPs is as favorable as coalescence under electron beam irradiation at room temperature. Using small‐sized (D ≈ 5.9 nm) and large‐sized (D ≈ 11.0 nm) gold (Au) NPs, and different electron dose rates, a unique sequential attraction‐repulsion between NPs is disclosed. The real‐time in situ transmission electron microscopy imaging suggest that at a low dose rate, two small‐sized AuNPs with 1.0 nm particle–particle distance undergo repulsion to 18 nm with a diffusion rate of 0.4 nm min−1. For large‐sized AuNPs, the repulsion rate is 0.08 nm min−1 at a low dose rate and is comparable to that of small‐sized AuNPs at a high dose rate. Surprisingly, large‐sized AuNPs at a high electron dose rate displayed attraction in the first 15 min, followed by rapid repulsion. This unique sequential attraction‐repulsion behavior of NPs offers possibilities to manipulate interparticle distance and properties without inducing dimensional changes for advanced photonic and plasmonic nanodevices.

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In Situ TEM Imaging Reveals the Dynamic Interplay Between Attraction, Repulsion and Sequential Attraction‐Repulsion in Gold Nanoparticles

Zulfiqar,

Honkanen,

Nonappa

et al. 2024

Small

View full text Add to dashboard Cite

show abstract

Depth sectioning using environmental and atomic-resolution STEM

Takeguchi,

Hashimoto,

Mitsuishi

2024

Microscopy

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(Scanning) transmission electron microscopy (TEM) images of samples in gas and liquid media are acquired with an environmental cell (EC) via silicon nitride membranes. The ratio of sample signal against the background is a significant factor for resolution. Depth-sectioning Scanning TEM (STEM) is a promising technique that enhances the signal for a sample embedded in a matrix. It can increase the resolution to the atomic level, thereby enabling EC-STEM applications in important areas. This review introduces depth-sectioning STEM and its applications to high-resolution EC-STEM imaging of samples in gases and in liquids.

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Simultaneous secondary electron microscopy in the scanning transmission electron microscope with applications for in situ studies

San Gabriel,

Qiu,

et al. 2024

Microscopy

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Scanning/transmission electron microscopy (STEM) is a powerful characterization tool for a wide range of materials. Over the years, STEMs have been extensively used for in situ studies of structural evolution and dynamic processes. A limited number of STEM instruments are equipped with a secondary electron (SE) detector in addition to the conventional transmitted electron detectors, i.e., the bright field (BF) and annular dark field (ADF) detectors. Such instruments are capable of simultaneous BF-STEM, ADF-STEM, and SE-STEM imaging. These methods can reveal the “bulk” information from BF and ADF signals and the surface information from SE signals for materials less than 200 nm thick. This review first summarizes the field of in situ STEM research, followed by the generation of SE signals, SE-STEM instrumentation, and applications of SE-STEM analysis. Combining with various MEMS-based in situ heating, gas reaction, and mechanical testing stages, we show that simultaneous SE-STEM imaging has found applications in studying the dynamics and transient phenomena of surface reconstructions, exsolution of catalysts, lunar and planetary materials, and mechanical properties of 2D thin films. Finally, we provide an outlook on the potential advancements in SE-STEM from the perspective of sample-related factors, instrument-related factors, and data acquisition and processing.

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Automated calculations for computing the sample-limited spatial resolution in (scanning) transmission electron microscopy

Cited by 3 publications

References 23 publications

In Situ TEM Imaging Reveals the Dynamic Interplay Between Attraction, Repulsion and Sequential Attraction‐Repulsion in Gold Nanoparticles

In Situ TEM Imaging Reveals the Dynamic Interplay Between Attraction, Repulsion and Sequential Attraction‐Repulsion in Gold Nanoparticles

Depth sectioning using environmental and atomic-resolution STEM

Simultaneous secondary electron microscopy in the scanning transmission electron microscope with applications for in situ studies

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