2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2016
DOI: 10.1109/ipfa.2016.7564255
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Automatic processing scheme for low laser invasiveness electro optical frequency mapping mode

Anthony Boscaro
1
,
Sabir Jacquir
2
,
Kévin Sanchez
3
et al.
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Cited by 3 publications
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References 18 publications
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Pattern image enhancement by automatic focus correction

Boscaro
1
,
Jacquir
2
,
Sanchez
3
et al. 2017
Microelectronics Reliability
2
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1
0
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Pattern image enhancement by automatic focus correction

Boscaro
1
,
Jacquir
2
,
Sanchez
3
et al. 2017
Microelectronics Reliability
2
0
1
0
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Application of electro optical frequency mapping (EOFM) in scan chain failure analysis for ASIC

Sheng1,
Ling2
2017
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
1
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Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory

Boscaro1,
Jacquir2,
Sanchez
3
et al. 2017
2017 20th International Conference on Information Fusion (Fusion)
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