Automatic test vector generation for mixed-signal circuits

Ayari, B.; Hamida, N. Ben; Kaminska, B.

doi:10.1109/edtc.1995.470320

Cited by 8 publications

(7 citation statements)

References 10 publications

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“…A sensitivity analysis can be made experimentally [1] or symbolically [10]. Herein, symbolic calculations are used.…”

Section: Sensitivity Computationmentioning

confidence: 99%

“…For instance, [1] presents models for parametric and catastrophic faults in passive components, [10] introduces large deviations of passive components, and [4] defines fault models for injecting shorts between digital and analog parts into the circuit description. In terms of test generation, the procedure proposed in [1] is based on the fault modeling introduced in [2], while the process of searching input stimuli of [8] considers catastrophic and parametric, AC and DC faults in passive and active components [12] and is assisted by a fault simulator [13].…”

Section: State-of-the-art and Contributionsmentioning

confidence: 99%

See 1 more Smart Citation

A CAT Tool for Frequency-domain Testing and Diagnosis on Analog

Cota¹,

Domenico²,

Lubaszewski³

1997

J. Braz. Comp. Soc.

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“…A sensitivity analysis can be made experimentally [1] or symbolically [10]. Herein, symbolic calculations are used.…”

Section: Sensitivity Computationmentioning

confidence: 99%

Section: State-of-the-art and Contributionsmentioning

confidence: 99%

A CAT Tool for Frequency-domain Testing and Diagnosis on Analog

Cota¹,

Domenico²,

Lubaszewski³

1997

J. Braz. Comp. Soc.

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“…According to the results presented in [2], only variations greater than 28.9% in R2 or in C2 could be detected, forcing the comparison parameters out of its 5% tolerance border. In the proposed method, we were able to detect 1% variations in both components, with comparison parameter variations of 20%, well beyond the 5% tolerance border.…”

Section: Comparison With Other Approachesmentioning

confidence: 99%

“…Presently, there are some reported works that generate a minimum excitation set in order to detect these type of faults [1], [2]. The general idea is to test the response of the circuit to a given frequency.…”

Section: Introductionmentioning

confidence: 99%

Efficient analog test methodology based on adaptive algorithms

Carro

Negreiros

1998

Proceedings of the 35th Annual Conference on Design Automation Conference - DAC '98

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This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such technique is used to test analog circuits, allowing complete fault coverage. The paper presents experimental results showing easy detection of soft, large-deviation and hard faults, with low cost instrumentation. Components variations from 5% to 1% have been detected, as the comparison parameter (output error power) varied from 300% to 20%.

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“…Test generation has been considered for analog circuits such as in [13], [25], [20], for mixed-signal circuits such as in [2], [15], [14], [29], [30], using a variety of techniques, such as static test generation [23], [28], sensitivity computation [13], Monte-Carlo simulation [25], [26], and optimization [5].…”

Section: Introductionmentioning

confidence: 99%