2020
DOI: 10.3390/quantum2040041
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Avalanche Photodetector Based on InAs/InSb Superlattice

Abstract: This work demonstrates a mid-wavelength infrared InAs/InSb superlattice avalanche photodiode (APD). The superlattice APD structure was grown by molecular beam epitaxy on GaSb substrate. The device exhibits a 100 % cut-off wavelength of 4.6 µm at 150 K and 4.30 µm at 77 K. At 150 and 77 K, the device responsivity reaches peak values of 2.49 and 2.32 A/W at 3.75 µm under −1.0 V applied bias, respectively. The device reveals an electron dominated avalanching mechanism with a gain value of 6 at 150 K and 7.4 at 77… Show more

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Cited by 19 publications
(11 citation statements)
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“…Table 3 presents SWIR [ 27 , 28 , 29 , 30 , 31 , 32 , 33 , 34 , 35 , 36 , 37 , 38 , 39 , 40 , 41 , 42 , 43 , 44 ], MWIR [ 45 , 46 , 47 , 48 , 49 , 50 ] (PIN, SAM and SACM) state-of-art and LWIR, λ ~ 8 μm (230 K) HgCdTe SAM APDs based devices to include maximum gain ( M ), impact ionization ratio ( k ), excess noise factor F ( M ) and dark current mostly at M = 10. As presented, the majority of the published papers corresponds to the T = 300 K and SWIR range.…”
Section: Comparison Of λ ~ 8 μM (230 K) Hgcdte Ver...mentioning
confidence: 99%
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“…Table 3 presents SWIR [ 27 , 28 , 29 , 30 , 31 , 32 , 33 , 34 , 35 , 36 , 37 , 38 , 39 , 40 , 41 , 42 , 43 , 44 ], MWIR [ 45 , 46 , 47 , 48 , 49 , 50 ] (PIN, SAM and SACM) state-of-art and LWIR, λ ~ 8 μm (230 K) HgCdTe SAM APDs based devices to include maximum gain ( M ), impact ionization ratio ( k ), excess noise factor F ( M ) and dark current mostly at M = 10. As presented, the majority of the published papers corresponds to the T = 300 K and SWIR range.…”
Section: Comparison Of λ ~ 8 μM (230 K) Hgcdte Ver...mentioning
confidence: 99%
“…The promising results were presented by Li et al reporting on MWIR λ = 5 μm, T = 200 K (4-stage TE cooling) k = 0.097, M = 29 and F ( M ) = 4.98 AlAsSb/GaSb SL SAM device [ 46 ]. The MWIR λ = 4.6 μm, T = 150 K InAs/InSb SL PIN device was presented by Dehzangi et al reporting on k = 0.27, M = 6 and F ( M ) = 2.95 [ 45 ]. The impact ionization coefficient for that structure is acceptable, but it is still much greater than the reported cases for HgCdTe and T2SLs InAs/GaSb APDs ( k < 0.001) [ 48 ].…”
Section: Comparison Of λ ~ 8 μM (230 K) Hgcdte Ver...mentioning
confidence: 99%
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“…High-frequency gating (sinusoidal gating [63,64], a self-differing technique [65,66]), can reduce the after-pulses probability since it reduces the total charge flow generated during an avalanche event, maintaining high detection rates at the same time. Recently, new studies are emerging on materials and superlattices, such as HgCdTe [67], InAs/InSb [68], AlAsSb/GaSb [69], which can extend the detection range of SPADs to MIR. However, significantly lower cooling temperatures (≈80 K) are required to suppress the dark current due to the low energy bandgap [67,70], resulting in increased costs and complexity of such devices.…”
Section: Single-photon Avalanche Diodesmentioning
confidence: 99%
“…However, they must operate at cryogenic temperatures to reduce dark currents due to their narrow band gap. Mid-wavelength infrared (MWIR) APDs based on groups III-V, such as InAs/InSb superlattices (SLs) 5 , have been demonstrated. However, their performance, especially the excess noise factor, is limited by the relatively small difference in ionization rates of electrons and holes.…”
Section: Introductionmentioning
confidence: 99%