Proceedings of the 52nd Annual Design Automation Conference 2015
DOI: 10.1145/2744769.2744805
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b-HiVE

Abstract: Existing timing error models for voltage-scaled functional units ignore the effect of history and correlation among outputs, and the variation in the error behavior at different bit locations. We propose b-HiVE, a model for voltage-scaling-induced timing errors that incorporates these attributes and demonstrates their impact on the overall model accuracy. On average across several operations, b-HiVE's estimation is within 1-3% of comprehensive analog simulations, which corresponds to 5-17x higher accuracy (6-1… Show more

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Cited by 24 publications
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References 22 publications
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