B20–MnSi films grown on Si(100) substrates with magnetic skyrmion signature

Li, Zichao; Yuan, Ye; Hübner, René; Begeza, Viktor; Naumann, Thomas; Rebohle, L.; Hellwig, Olav; Helm, M.; Nielsch, Kornelius; Prucnal, S.; Zhou, Shengqiang

doi:10.1016/j.mtphys.2021.100541

Cited by 3 publications

(2 citation statements)

References 45 publications

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“…Literature suggests that the thickness of the film is a crucial parameter [3,33] that can affect the stability of magnetic skyrmions in MnSi [29]. The MnSi thin film of thickness 25 nm was deposited on a c-cut sapphire (Al 2 O 3 ) substrate with the help of radio-frequency (RF)/direct current (DC) magnetron sputtering method.…”

Section: Methodsmentioning

confidence: 99%

Evolution of bulk magnetic structure in MnSi thin film: a soft x-ray magnetic circular dichroism study

Jena¹,

Choi²,

Gardner³

et al. 2023

Phys. Scr.

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Skyrmionic materials have exceptionally stable topologically protected chiral structures, the B20 helimagnetic MnSi is regarded as the best contender in this category. A non-centrosymmetric polycrystalline, MnSi thin films were fabricated on a c-sapphire substrate using a radio-frequency magnetron sputtering method. The structural and optical characteristics of the topological MnSi were examined using x-ray diffraction, Ultraviolet-visible spectroscopy, and Fourier-transform infrared spectroscopy technique. The most sophisticated tools like Vibrating sample magnetometer, element-specific soft x-ray absorption spectroscopy and soft-x-ray magnetic circular dichroism (XMCD) were used to probe its electronic and magnetization behaviour. The material exhibits a higher degree of magnetization signifying ferromagnetism in the bulk region as observed at ∼ 300 K and ∼ 670 K. The measured XMCD intensity at 300 K in the bulk-sensitive total-fluorescence-yield mode increased from 0 T to 2 T, which also raises the possibility of long-range ferromagnetic ordering in it. In this perspective of research, MnSi is recognised as a developing material for spintronic-based devices.

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Section: Methodsmentioning

confidence: 99%

Evolution of bulk magnetic structure in MnSi thin film: a soft x-ray magnetic circular dichroism study

Jena¹,

Choi²,

Gardner³

et al. 2023

Phys. Scr.

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“…They studied the spin Hall effect by using CoSi/CoFeB/MgO heterostructures . We have prepared single-phase B20-MnSi films by flash-lamp annealing thanks to their fast heating and cooling rates. , By controlling the heating rates and the annealing temperature, different phases can be separated. Thus, this method probably offers a possibility to fabricate pure B20-CoSi films.…”

Section: Introductionmentioning

confidence: 99%

B20 Weyl Semimetal CoSi Film Fabricated by Flash-Lamp Annealing

Yuan

Hübner

et al. 2023

ACS Appl. Mater. Interfaces

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B20-CoSi is a newly discovered Weyl semimetal that crystallizes into a noncentrosymmetric crystal structure. However, the investigation of B20-CoSi has so far been focused on bulk materials, whereas the growth of thin films on technology-relevant substrates is a prerequisite for most practical applications. In this study, we have used millisecond-range flash-lamp annealing, a nonequilibrium solid-state reaction, to grow B20-CoSi thin films. By optimizing the annealing parameters, we were able to obtain thin films with a pure B20-CoSi phase. The magnetic and transport measurements indicate the appearance of the charge density wave and chiral anomaly. Our work presents a promising method for preparing thin films of most binary B20 transition-metal silicides, which are candidates for topological Weyl semimetals.

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Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy

Jena,

Urkude,

Choi

et al. 2024

Journal of Applied Physics

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Magnetic nanometric skyrmions are small complex vortex-like topological defects, mainly found in non-centrosymmetric crystals such as MnSi. They have potential applications for future spintronic devices. In this article, the structural, electronic, and magnetic states of the Mn atoms in a polycrystalline MnSi thin film facing a c-sapphire substrate were studied using x-ray diffraction, x-ray photo-emission spectroscopy, resonance photoemission spectroscopy (RPES), and extended x-ray absorption fine structure (EXAFS). The valence band spectra indicate the metallic nature of the film. The RPES study reveals the presence of major itinerant Mn 3d states near EF and also the mixed Mn 3d and Si 3s–3p states from 5.3 to 11.3 eV. The EXAFS spectrum does not show the existence of oxygen vacancies in the system, and the obtained magnetic moment in the non-stoichiometric MnSi thin film is a combination of the partially itinerant and partially localized Mn 3d states.

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B20–MnSi films grown on Si(100) substrates with magnetic skyrmion signature

Cited by 3 publications

References 45 publications

Evolution of bulk magnetic structure in MnSi thin film: a soft x-ray magnetic circular dichroism study

Evolution of bulk magnetic structure in MnSi thin film: a soft x-ray magnetic circular dichroism study

B20 Weyl Semimetal CoSi Film Fabricated by Flash-Lamp Annealing

Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy

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