Backward transition radiation in EUV-region as a possible tool for beam diagnostics

Сухих, Л.; Gogolev, S.Yu.; Потылицын, А. П.

doi:10.1016/j.nima.2010.03.072

Cited by 7 publications

(4 citation statements)

References 4 publications

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“…In general, the probability of coherent emission decreases at shorter wavelengths, which is often not sufficiently reduced for optical wavelengths, and imaging with transition radiation in the EUV region might be an option [52][53][54]. In addition to the knowledge and control of the spectra, the imaging with EUV radiation also requires dedicated detectors and optics, and a complete set-up in vacuum to prevent strong absorption in air.…”

Section: A Spectral Separationmentioning

confidence: 99%

Electron beam profile imaging in the presence of coherent optical radiation effects

Behrens

Gerth

Kube

et al. 2012

Phys. Rev. ST Accel. Beams

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High-brightness electron beams with low energy spread at existing and future x-ray free-electron lasers are affected by various collective beam self-interactions and microbunching instabilities. The corresponding coherent optical radiation effects, e.g., coherent optical transition radiation, impede electron beam profile imaging and become a serious issue for all kinds of electron beam diagnostics using imaging screens. Furthermore, coherent optical radiation effects can also be related to intrinsically ultrashort electron bunches or the existence of ultrashort spikes inside the electron bunches. In this paper, we discuss methods to suppress coherent optical radiation effects both by electron beam profile imaging in dispersive beam lines and by using scintillation imaging screens in combination with separation techniques. The suppression of coherent optical emission in dispersive beam lines is shown by analytical calculations, numerical simulations, and measurements. Transverse and longitudinal electron beam profile measurements in the presence of coherent optical radiation effects in nondispersive beam lines are demonstrated by applying a temporal separation technique.

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Section: A Spectral Separationmentioning

confidence: 99%

Electron beam profile imaging in the presence of coherent optical radiation effects

Behrens

Gerth

Kube

et al. 2012

Phys. Rev. ST Accel. Beams

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“…The idea to use BTR in the extreme ultraviolet (EUV) region at λ ≃ 20 nm was first published in Ref. [19]. This paper presents the results of an experimental study to demonstrate the applicability of EUV BTR for electron beam profile diagnostics.…”

Section: Introductionmentioning

confidence: 98%

Backward transition radiation in the extreme ultraviolet region as a tool for the transverse beam profile diagnostic

Сухих

Kube

Bajt

et al. 2014

Phys. Rev. ST Accel. Beams

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The present article summarizes the results of two experiments which were performed to study the radiation properties of backward transition radiation (BTR) in the extreme ultraviolet (EUV) region. This wavelength region is of particular interest for transverse beam profile imaging, because the spatial resolution is improved as a result of the reduced contribution in the imaging process of the fundamental diffraction limit. In addition, the influence of coherent effects in the transition radiation emission process, which have been observed in the visible region, might be mitigated. The first experiment, dedicated to the investigation of the BTR angular characteristics, indicates that the radiation yield in the EUV region is higher than theoretically expected and that it is even comparable to the yield in the visible region. The second measurement was devoted to transverse beam profile imaging based on quasimonochromatic BTR, in both the EUV and the visible region, and is a proof-of-principle experiment demonstrating that EUV BTR is a suitable candidate for standard beam profile diagnostics.

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“…Rapid advances and the application prospects of coherent x-ray sources [13][14][15] call for the development of a reliable technique for coherent reflection imaging similar to that used in the transmission mode [4,[16][17][18]. Another example is the diagnostics of submicron size electron bunches in modern accelerators (see [19][20][21][22][23][24]). In this case the footprint of an electron beam impinging on a tilted target is imaged with magnification in the EUV and soft x-ray part of the transition radiation spectrum [25].…”

Section: Introductionmentioning

confidence: 99%

Coherent scattering from tilted objects

Artyukov

Feshchenko

Popov

et al. 2014

J. Opt.

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The extension of the Fresnel integral to tilted objects is studied using both analytical and numerical approaches. Exact solutions of the parabolic wave equation are used for this purpose. The wavefields produced by a beam propagating at an arbitrary angle θ = π/2 relative to the object surface are investigated. The diffraction patterns are simulated for 1 • ≤ θ ≤ 10 • . It is shown that the inverse problem for tilted objects can be reduced to a Fredholm-type integral equation. Both 2D and 3D geometries are considered. The results may be useful as a theoretical framework for the development of coherent reflection imaging of tilted objects and x-ray imaging of submicron footprints of relativistic electron beams for measurement of their size and shape.

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Backward transition radiation in EUV-region as a possible tool for beam diagnostics

Cited by 7 publications

References 4 publications

Electron beam profile imaging in the presence of coherent optical radiation effects

Electron beam profile imaging in the presence of coherent optical radiation effects

Backward transition radiation in the extreme ultraviolet region as a tool for the transverse beam profile diagnostic

Coherent scattering from tilted objects

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