27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium
DOI: 10.1109/iemt.2002.1032754
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Ball shear versus ball pull test methods for evaluating interfacial failures in area array packages

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Cited by 12 publications
(8 citation statements)
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“…In this test the solder ball is sheared off using a chisel like tool. Several researches compared one of the methods with drop impact testing [6,7]. It seems CBP testing has an advantage over high-speed shear testing.…”
Section: Cold Bump Pull (Cbp)mentioning
confidence: 99%
“…In this test the solder ball is sheared off using a chisel like tool. Several researches compared one of the methods with drop impact testing [6,7]. It seems CBP testing has an advantage over high-speed shear testing.…”
Section: Cold Bump Pull (Cbp)mentioning
confidence: 99%
“…Ball shear test has been used for monitoring the solder joint strength for BGA packages [5][6][7][8][9]. However, ball shear testing did not detect the correct failure mode in the brittle solder joint for flip chip ball grid array (FCBGA) packages.…”
Section: Introductionmentioning
confidence: 99%
“…Currently the most popular method to evaluate the strength of the solder ball attachment is the ball shear test [6][7][8][9][10][11][12][13], which is adopted from the Joint Electron Device Engineering Council (JEDEC) standard JESD22-B117A [6]. Currently, a new method called the ball pull test has emerged as an attractive alternative to the traditional ball shear test as an interconnect monitor [11,12].…”
mentioning
confidence: 99%
“…Many researchers and engineers used the conventional ball shear test (shearing speed is less than 0.8 mm/sec) to evaluate the reliability of solder joints in the past decade [7][8][9][10][11][12][13]. Huang et al (2001 and2002) first studied the ball shear test in terms of the effects of shear speed and shear height [8,9].…”
mentioning
confidence: 99%
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