2023
DOI: 10.1016/j.tsf.2023.139737
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Band gap narrowing induced by oxygen vacancies in reactively sputtered TiO2 thin films

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Cited by 19 publications
(4 citation statements)
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“…Typically, surface defects can trap/de-trap electrons. Vacancies and/or dangling bonds are also defects [ 40 , 41 ], but they can be considered electron donors. If dangling bonds or vacancies are occupied by molecules like oxygen species having high electronegativities, and/or physi-/chemi-sorbed oxygen species are attached to the surfaces, they may reduce the free charge carrier densities, capturing conducting electrons at their sites.…”
Section: Resultsmentioning
confidence: 99%
“…Typically, surface defects can trap/de-trap electrons. Vacancies and/or dangling bonds are also defects [ 40 , 41 ], but they can be considered electron donors. If dangling bonds or vacancies are occupied by molecules like oxygen species having high electronegativities, and/or physi-/chemi-sorbed oxygen species are attached to the surfaces, they may reduce the free charge carrier densities, capturing conducting electrons at their sites.…”
Section: Resultsmentioning
confidence: 99%
“…The formation of V O in the nanoparticles due to the reducing thermal treatment was also investigated by characterizing the optical properties of stoichiometric SnO 2 and SnO 2 -V O . In particular, the implementation of bulk V O in a crystalline metal oxide should involve a band gap narrowing compared to the stoichiometric semiconductor, due to the doping effect of the oxygen vacancies that behave as defects in the crystal structure, leading to the shift of the Fermi level towards the conduction band as well as the creation of mid-gap donor states that may overlap with the electronic states at the conduction band and/or valence band edges [44,45]. The optical absorption spectra of stoichiometric SnO 2 and SnO 2 -V O nanopowders, collected by means of a UV-vis spectrometer, are shown in Figure 5.…”
Section: Sensing Materials Characterizationmentioning
confidence: 99%
“…The optical bandgap values were estimated from the Tauc plots, and this value decreased from 2.51 eV to 2.44 eV with increasing Ti deposition power from 25 W to 50 W due to the generation of more oxygen vacancies. [42,49] Interestingly, the inset in Figure S4a (Supporting Information) shows the tail absorbance band in the range of 700 -850 nm for Ti:BiVO 4 films, indicating the formation of oxygen vacancies in those films. [50] The tail absorbance value increases with Ti deposition power, indicating the formation of more oxygen vacancies for higher Ti deposition power, which is at par with the XPS results.…”
Section: Optical Propertiesmentioning
confidence: 99%