The structural stability of 2D transition metal dichalcogenide (TMD) formations is of particular importance for their reliable device performance in nano-electronics and opto-electronics. Recent observations show that the CVD-grown TMD monolayers are likely to encounter stability problems such as cracking or fracturing when they are kept under ambient conditions. Here, two different growth configurations are investigated and a favorable growth geometry is proposed, which also sheds light onto the growth mechanism and provides a solution for the stability and fracture formation issues for TMDs specifically for MoS 2 monolayers. It is shown that 18 months naturally and thermally aged MoS 2 monolayer flakes grown using specifically developed conditions, retain their stability. To understand the mechanism of the structural deterioration, two possible effective mechanisms, S vacancy defects and growth-induced tensile stress, are assessed by the first principle calculations where the role of S vacancy defects in obtaining oxidation resistant MoS 2 monolayer flakes is revealed to be rather more critical. Hence, these simulations, time-dependent observations and thermal aging experiments show that durability and stability of 2D MoS 2 flakes can be controlled by CVD growth configuration.Two-dimensional (2D) transition metal dichalcogenide (TMD) semiconductors such as monolayer or few-layer MoS 2 , WS 2 , MoSe 2 , etc. have attracted significant attention due to their potentially disruptive electronic and optical properties. In particular, researchers have put significant effort to adopt these materials in future optoelectronic and photonic applications. [1,2]