Gas Sensors Based on Conducting Metal Oxides 2019
DOI: 10.1016/b978-0-12-811224-3.00003-2
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Basics of semiconducting metal oxide–based gas sensors

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Cited by 22 publications
(15 citation statements)
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“…3 The sensing performance of MOX-based gas sensors strongly depends on the electrical conduction, which is affected by the number of charge carriers and active sites available on the surface, of the sensing material. 4 Large specific surface area and point defects, which promotes adsorption and desorption of oxygen ions and gas atoms from the sensor materials, as well as morphology and crystallographic structures, are factors reported to have an influence on the gas-sensing performance. 5 Most of the gas sensor research thus far was directed toward using n-type MOX semiconductors, such as CeO 2 , SnO 2 , WO 3 , or ZnO for gas sensors.…”
Section: Introductionmentioning
confidence: 99%
“…3 The sensing performance of MOX-based gas sensors strongly depends on the electrical conduction, which is affected by the number of charge carriers and active sites available on the surface, of the sensing material. 4 Large specific surface area and point defects, which promotes adsorption and desorption of oxygen ions and gas atoms from the sensor materials, as well as morphology and crystallographic structures, are factors reported to have an influence on the gas-sensing performance. 5 Most of the gas sensor research thus far was directed toward using n-type MOX semiconductors, such as CeO 2 , SnO 2 , WO 3 , or ZnO for gas sensors.…”
Section: Introductionmentioning
confidence: 99%
“…“ Operando ” refers to performing under application‐ relevant conditions on real sensor devices and involves the real‐ time evaluation of the sensor performance of the probed specimen. [ 18,76 ]…”
Section: Characterization Of Oxygen Defects In Nanostructured Metal Omentioning
confidence: 99%
“…These spectroscopic techniques were developed from an in situ to a powerful operando technique for gas sensor research within a few years. [ 18,56,79,80‐81 ] For example, Chen et al . employed the in situ diffuse reflectance infrared Fourier transform spectroscopy ( in situ DRIFTS) technique…”
Section: Characterization Of Oxygen Defects In Nanostructured Metal Omentioning
confidence: 99%
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